| Geometria fractal: propriedades e características de fractais ideais TA Assis, JG Vivas Miranda, FB Mota, RFS Andrade, CMC Castilho Revista Brasileira de ensino de física 30, 2304.1-2304.10, 2008 | 92 | 2008 |
| Minimal domain size necessary to simulate the field enhancement factor numerically with specified precision TA de Assis, FF Dall’Agnol Journal of Vacuum Science & Technology B 37 (2), 2019 | 38 | 2019 |
| Mechanically stable nanostructures with desirable characteristic field enhancement factors: a response from scale invariance in electrostatics TA de Assis, FF Dall’Agnol Nanotechnology 27 (44), 44LT01, 2016 | 31 | 2016 |
| Dissolution of minerals with rough surfaces TA de Assis, FDAA Reis Geochimica et Cosmochimica Acta 228, 27-41, 2018 | 28 | 2018 |
| Physics-based derivation of a formula for the mutual depolarization of two post-like field emitters FF Dall’Agnol, TA De Assis, RG Forbes Journal of Physics: Condensed Matter 30 (37), 375703, 2018 | 25 | 2018 |
| The consequences of dependence between the formal area efficiency and the macroscopic electric field on linearity behavior in Fowler–Nordheim plots TA De Assis, FF Dall’Agnol, RFS Andrade Journal of Physics D: Applied Physics 49 (35), 355301, 2016 | 22 | 2016 |
| Evidence of universal inverse-third power law for the shielding-induced fractional decrease in apex field enhancement factor at large spacings: a response via accurate Laplace … TA De Assis, FF Dall’Agnol Journal of Physics: Condensed Matter 30 (19), 195301, 2018 | 20 | 2018 |
| Field emitter electrostatics: a review with special emphasis on modern high-precision finite-element modelling TA de Assis, FF Dall’Agnol, RG Forbes Journal of Physics: Condensed Matter 34 (49), 493001, 2022 | 19 | 2022 |
| Trade-off between the electrostatic efficiency and mechanical stability of two-stage field emitter structures TA de Assis, FF Dall'Agnol Journal of Applied Physics 121 (1), 2017 | 19 | 2017 |
| Nanotechnology 27, 44LT01 (2016) TA de Assis, FF Dall’Agnol | 19 | |
| Universal trade-off between proximity and aspect-ratio in optimizing the field enhancement factor of large area field emitters TA de Assis, FF Dall'Agnol, M Cahay Applied Physics Letters 116 (20), 2020 | 18 | 2020 |
| Close proximity electrostatic effect from small clusters of emitters FF Dall’Agnol, TA De Assis Journal of Physics: Condensed Matter 29 (40), 40LT01, 2017 | 18 | 2017 |
| Dynamic scaling and temperature effects in thin film roughening TA de Assis, FDAA Reis Journal of Statistical Mechanics: Theory and Experiment 2015 (6), P06023, 2015 | 18 | 2015 |
| Improving the extraction of characteristic field enhancement factors from nonlinear Fowler–Nordheim plots: Call for experimental tests TA de Assis Journal of Vacuum Science & Technology B 33 (5), 2015 | 16 | 2015 |
| The role of Hurst exponent on cold field electron emission from conducting materials: from electric field distribution to Fowler-Nordheim plots TA De Assis Scientific Reports 5 (1), 10175, 2015 | 16 | 2015 |
| Determining the field enhancement factors of various field electron emitters with high numerical accuracy FF Dall’Agnol, SV Filippov, EO Popov, AG Kolosko, TA de Assis Journal of Vacuum Science & Technology B 39 (3), 2021 | 15 | 2021 |
| Smoothening in thin-film deposition on rough substrates TA De Assis, FDAA Reis Physical Review E 92 (5), 052405, 2015 | 15 | 2015 |
| Influence of the distribution of local field enhancement factors on the shape of the current-voltage characteristics of carbon-nanotube-based large-area emitters EO Popov, AG Kolosko, SV Filippov, TA de Assis Vacuum 173, 109159, 2020 | 13 | 2020 |
| Restoring observed classical behavior of the carbon nanotube field emission enhancement factor from the electronic structure CP de Castro, TA de Assis, R Rivelino, F de B. Mota, CMC de Castilho, ... The Journal of Physical Chemistry C 123 (8), 5144-5149, 2019 | 13 | 2019 |
| Optimal detrended fluctuation analysis as a tool for the determination of the roughness exponent of the mounded surfaces EEM Luis, TA de Assis, SC Ferreira Physical Review E 95 (4), 042801, 2017 | 13 | 2017 |
Fernando F Dall'AgnolUniversidade Federal de Santa Catarina-BlumenauVerified email at ufsc.br
