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Christopher Waddington
Christopher Waddington
University of Waterloo
Verified email at uwaterloo.ca
Title
Cited by
Cited by
Year
Analysis of measurement sensitivity to illuminance and fringe-pattern gray levels for fringe-pattern projection adaptive to ambient lighting
C Waddington, J Kofman
Optics and Lasers in Engineering 48 (2), 251-256, 2010
1032010
Modified sinusoidal fringe-pattern projection for variable illuminance in phase-shifting three-dimensional surface-shape metrology
C Waddington, J Kofman
Optical Engineering 53 (8), 084109-084109, 2014
622014
Saturation avoidance by adaptive fringe projection in phase-shifting 3D surface-shape measurement
C Waddington, J Kofman
2010 international symposium on optomechatronic technologies, 1-4, 2010
602010
Camera-independent saturation avoidance in measuring high-reflectivity-variation surfaces using pixel-wise composed images from projected patterns of different maximum gray level
C Waddington, J Kofman
Optics Communications 333, 32-37, 2014
572014
Sinusoidal fringe-pattern projection for 3-D surface measurement with variable illuminance
C Waddington, J Kofman
2010 international symposium on optomechatronic technologies, 1-5, 2010
172010
Adaptive Fringe Pattern Projection Techniques for Imgae Saturation Avoidance in 3D Surface Measurement
C Waddington
University of Waterloo, 2010
12010
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