| An overview of the BlueGene/L supercomputer NR Adiga, G Almási, GS Almasi, Y Aridor, R Barik, D Beece, R Bellofatto, ... SC'02: Proceedings of the 2002 ACM/IEEE Conference on Supercomputing, 60-60, 2002 | 678 | 2002 |
| Can EDA combat the rise of electronic counterfeiting? F Koushanfar, S Fazzari, C McCants, W Bryson, M Sale, P Song, ... Proceedings of the 49th Annual Design Automation Conference, 133-138, 2012 | 96 | 2012 |
| A novel scan chain diagnostics technique based on light emission from leakage current P Song, F Stellari, T Xia, AJ Weger 2004 International Conferce on Test, 140-147, 2004 | 82 | 2004 |
| Testing and diagnostics of CMOS circuits using light emission from off-state leakage current F Stellari, P Song, JC Tsang, MK McManus, MB Ketchen IEEE transactions on electron devices 51 (9), 1455-1462, 2004 | 73 | 2004 |
| AC scan diagnostic method F Motika, PJ Nigh, P Song, HB Druckerman US Patent 6,516,432, 2003 | 71 | 2003 |
| Method and apparatus for creating time-resolved emission images of integrated circuits using a single-point single-photon detector and a scanning system F Stellari, A Tosi, F Zappa, P Song US Patent 8,115,170, 2012 | 55 | 2012 |
| Verification of untrusted chips using trusted layout and emission measurements F Stellari, P Song, AJ Weger, J Culp, A Herbert, D Pfeiffer 2014 IEEE international symposium on hardware-oriented security and trust …, 2014 | 54 | 2014 |
| 1Mb 0.41 µm2 2T-2R cell nonvolatile TCAM with two-bit encoding and clocked self-referenced sensing J Li, R Montoye, M Ishii, K Stawiasz, T Nishida, K Maloney, G Ditlow, ... 2013 Symposium on VLSI Technology, C104-C105, 2013 | 52 | 2013 |
| MARVEL—Malicious alteration recognition and verification by emission of light P Song, F Stellari, D Pfeiffer, J Culp, A Weger, A Bonnoit, B Wisnieff, ... 2011 IEEE International Symposium on Hardware-Oriented Security and Trust …, 2011 | 47 | 2011 |
| Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs K Chatty, P Cottrell, R Gauthier, M Muhammad, F Stellari, A Weger, ... 2004 IEEE International Reliability Physics Symposium. Proceedings, 130-134, 2004 | 47 | 2004 |
| Diagnosis and characterization of timing-related defects by time-dependent light emission D Knebel, P Sanda, M McManus, JA Kash, JC Tsang, D Vallett, ... Proceedings International Test Conference 1998 (IEEE Cat. No. 98CH36270 …, 1998 | 46 | 1998 |
| Scan structure for improving transition fault coverage and scan diagnostics P Song, RF Rizzolo, F Motika, UW Baur US Patent 6,490,702, 2002 | 42 | 2002 |
| Cellular supercomputing with system-on-a-chip G Almasi, GS Almasi, D Beece, R Bellofatto, G Bhanot, R Bickford, ... 2002 IEEE International Solid-State Circuits Conference. Digest of Technical …, 2002 | 39 | 2002 |
| Photon emission microscopy of inter/intra chip device performance variations S Polonsky, M Bhushan, A Gattiker, A Weger, P Song Microelectronics reliability 45 (9-11), 1471-1475, 2005 | 38 | 2005 |
| Stuck-at fault scan chain diagnostic method F Motika, PJ Nigh, P Song US Patent 7,010,735, 2006 | 37 | 2006 |
| Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latchup A Weger, S Voldman, F Stellari, P Song, P Sanda, M McManus 2003 IEEE International Reliability Physics Symposium Proceedings, 2003 …, 2003 | 37 | 2003 |
| Benchmarking at the frontier of hardware security: Lessons from logic locking B Tan, R Karri, N Limaye, A Sengupta, O Sinanoglu, MM Rahman, ... arXiv preprint arXiv:2006.06806, 2020 | 35 | 2020 |
| Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip MP Kusko, BJ Robbins, TJ Snethen, P Song, TG Foote, WV Huott Proceedings International Test Conference 1998 (IEEE Cat. No. 98CH36270 …, 1998 | 34 | 1998 |
| Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements F Stellari, KA Jenkins, AJ Weger, B Linder, P Song 2015 IEEE International Reliability Physics Symposium, 2B. 1.1-2B. 1.6, 2015 | 33 | 2015 |
| Diagnostic techniques for the IBM S/390 600 MHz G5 microprocessor P Song, F Motika, D Knebel, R Rizzolo, M Kusko, J Lee, M McManus International Test Conference 1999. Proceedings (IEEE Cat. No. 99CH37034 …, 1999 | 33 | 1999 |
