Eric M. Monroe
Title
Cited by
Cited by
Year
A generalized linear model approach to designing accelerated life test experiments
EM Monroe, R Pan, CM Anderson‐Cook, DC Montgomery, CM Borror
Quality and Reliability Engineering International 27 (4), 595-607, 2011
342011
Sensitivity analysis of optimal designs for accelerated life testing
EM Monroe, R Pan, CM Anderson-Cook, DC Montgomery, CM Borror
Journal of quality technology 42 (2), 121-135, 2010
312010
Use-condition-based cyclic bend test development for handheld components
LL Mercado, B Phillips, S Sahasrabudhe, JP Sedillo, D Bray, E Monroe, ...
2004 Proceedings. 54th Electronic Components and Technology Conference (IEEE …, 2004
312004
Understanding the effect of dwell time on fatigue life of packages using thermal shock and intrinsic material behavior
S Sahasrabudhe, E Monroe, S Tandon, M Patel
53rd Electronic Components and Technology Conference, 2003. Proceedings …, 2003
172003
Experimental design considerations for accelerated life tests with nonlinear constraints and censoring
EM Monroe, R Pan
Journal of quality technology 40 (4), 355-367, 2008
162008
Knowledge‐based reliability assessments for time‐varying climates
EM Monroe, R Pan
Quality and reliability engineering international 25 (1), 111-124, 2009
132009
Handheld use condition-based bend test development
LL Mercado, B Phillips, S Sahasrabudhe, JP Sedillo, D Bray, E Monroe, ...
IEEE transactions on advanced packaging 29 (2), 240-249, 2006
112006
Optimal experimental designs for accelerated life tests with censoring and constraints
EM Monroe
Arizona State University, 2009
72009
Ambient use-condition models for reliability assessment
C Gu, RF Kwasnick, NR Mielke, EM Monroe, CG Shirley
2006 IEEE International Reliability Physics Symposium Proceedings, 299-306, 2006
72006
Knowledge-basedReliability AssessmentsforTime-varying Climates
EM Monroe, R Pan
2008
Challenges and advances in use-condition-based mechanical reliability test development
LL Mercado, S Sahasrabudhe, E Monroe
Fifth International Conference onElectronic Packaging Technology Proceedings …, 2003
2003
Modeling and Analysis of Profiled Reliability Tests using Computation-Intensive Statistical Methods
R Pan, EM Monroe
The system can't perform the operation now. Try again later.
Articles 1–12