| A generalized linear model approach to designing accelerated life test experiments EM Monroe, R Pan, CM Anderson‐Cook, DC Montgomery, CM Borror Quality and Reliability Engineering International 27 (4), 595-607, 2011 | 43 | 2011 |
| Sensitivity analysis of optimal designs for accelerated life testing EM Monroe, R Pan, CM Anderson-Cook, DC Montgomery, CM Borror Journal of Quality Technology 42 (2), 121-135, 2010 | 34 | 2010 |
| Use-condition-based cyclic bend test development for handheld components LL Mercado, B Phillips, S Sahasrabudhe, JP Sedillo, D Bray, E Monroe, ... 2004 Proceedings. 54th Electronic Components and Technology Conference (IEEE …, 2004 | 33 | 2004 |
| Experimental design considerations for accelerated life tests with nonlinear constraints and censoring EM Monroe, R Pan Journal of Quality Technology 40 (4), 355-367, 2008 | 22 | 2008 |
| Understanding the effect of dwell time on fatigue life of packages using thermal shock and intrinsic material behavior S Sahasrabudhe, E Monroe, S Tandon, M Patel 53rd Electronic Components and Technology Conference, 2003. Proceedings …, 2003 | 21 | 2003 |
| Knowledge‐based reliability assessments for time‐varying climates EM Monroe, R Pan Quality and reliability engineering international 25 (1), 111-124, 2009 | 12 | 2009 |
| Handheld use condition-based bend test development LL Mercado, B Phillips, S Sahasrabudhe, JP Sedillo, D Bray, E Monroe, ... IEEE transactions on advanced packaging 29 (2), 240-249, 2006 | 12 | 2006 |
| Ambient use-condition models for reliability assessment C Gu, RF Kwasnick, NR Mielke, EM Monroe, CG Shirley 2006 IEEE International Reliability Physics Symposium Proceedings, 299-306, 2006 | 8 | 2006 |
| Optimal experimental designs for accelerated life tests with censoring and constraints EM Monroe Arizona State University, 2009 | 7 | 2009 |
| Knowledge-basedReliability AssessmentsforTime-varying Climates EM Monroe, R Pan | | 2008 |
| Challenges and advances in use-condition-based mechanical reliability test development LL Mercado, S Sahasrabudhe, E Monroe Fifth International Conference onElectronic Packaging Technology Proceedings …, 2003 | | 2003 |
| Modeling and Analysis of Profiled Reliability Tests using Computation-Intensive Statistical Methods R Pan, EM Monroe | | |
