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Frédéric B. Leloup
Frédéric B. Leloup
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Title
Cited by
Cited by
Year
Design of an instrument for measuring the spectral bidirectional scatter distribution function
FB Leloup, S Forment, P Dutré, MR Pointer, P Hanselaer
Applied optics 47 (29), 5454-5467, 2008
1042008
Toward the soft metrology of surface gloss: A review
FB Leloup, G Obein, MR Pointer, P Hanselaer
Color Research & Application 39 (6), 559-570, 2014
802014
Geometry of illumination, luminance contrast, and gloss perception
FB Leloup, MR Pointer, P Dutré, P Hanselaer
JOSA A 27 (9), 2046-2054, 2010
552010
Overall gloss evaluation in the presence of multiple cues to surface glossiness
FB Leloup, MR Pointer, P Dutré, P Hanselaer
JOSA A 29 (6), 1105-1114, 2012
382012
Luminance-based specular gloss characterization
FB Leloup, MR Pointer, P Dutré, P Hanselaer
JOSA A 28 (6), 1322-1330, 2011
342011
Determination of the bulk scattering parameters of diffusing materials
S Leyre, FB Leloup, J Audenaert, G Durinck, J Hofkens, G Deconinck, ...
Applied optics 52 (18), 4083-4090, 2013
262013
Metrological issues related to BRDF measurements around the specular direction in the particular case of glossy surfaces
G Obein, J Audenaert, G Ged, FB Leloup
Measuring, Modeling, and Reproducing Material Appearance 2015 9398, 95-104, 2015
222015
Development of an image-based gloss measurement instrument
FB Leloup, J Audenaert, P Hanselaer
Journal of Coatings Technology and Research 16, 913-921, 2019
202019
" Multidimensional reflectometry for industry"(xD-Reflect) an European research project
A Höpe, A Koo, FM Verdú, FB Leloup, G Obein, G Wübbeler, J Campos, ...
Measuring, Modeling, and Reproducing Material Appearance 9018, 9-19, 2014
172014
Characterization of gonio-apparent colours
F Leloup, P Hanselaer, MR Pointer, J Versluys
10th AIC Congress Granada, 515-518, 2005
172005
Repeatability and reproducibility of specular gloss meters in theory and practice
FB Leloup, J Audenaert, G Obein, G Ged, P Hanselaer
Journal of coatings technology and research 13, 941-951, 2016
162016
Optical path length enhancement for> 13% screenprinted thin film silicon solar cells
F Duerinckx, IK Filipek, K Nieuwenhuysen, G Beaucarne, J Poortmans, ...
21st European Photovoltaic Solar Energy Conference 4 (8), 2006
162006
Practical limitations of near-field goniophotometer measurements imposed by a dynamic range mismatch
J Audenaert, P Hanselaer, FB Leloup
Optics Express 23 (3), 2240-2251, 2015
142015
Simulating the spatial luminance distribution of planar light sources by sampling of ray files
J Audenaert, G Durinck, FB Leloup, G Deconinck, P Hanselaer
Optics Express 21 (20), 24099-24111, 2013
142013
BRDF and gloss measurements
F Leloup, P Hanselaer, SAB Forment
CIE Expert Symposium on Visual Appearance, 2007
142007
Multilateral spectral radiance factor scale comparison
C Strothkämper, A Ferrero, A Koo, P Jaanson, G Ged, G Obein, S Källberg, ...
Applied Optics 56 (7), 1996-2006, 2017
122017
Bayesian deconvolution method applied to experimental bidirectional transmittance distribution functions
J Audenaert, FB Leloup, G Durinck, G Deconinck, P Hanselaer
Measurement Science and Technology 24 (3), 035202, 2013
112013
Integration of Multiple Cues for Visual Gloss Evaluation
FB Leloup, P Hanselaer, MR Pointer, P Dutré
Proc. Predicting Perceptions: the 3rd International Conference on Appearance …, 2012
112012
Development of an image-based measurement instrument for gloss characterization
S Beuckels, J Audenaert, P Hanselaer, FB Leloup
Journal of Coatings Technology and Research 19 (5), 1567-1582, 2022
102022
Impact of the accurateness of bidirectional reflectance distribution function data on the intensity and luminance distributions of a light-emitting diode mixing chamber as …
J Audenaert, FB Leloup, B Van Giel, G Durinck, G Deconinck, ...
Optical Engineering 52 (9), 095101-095101, 2013
102013
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