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Peverini Luca
Peverini Luca
Thales SESO
Verified email at fr.thalesgroup.com
Title
Cited by
Cited by
Year
Two-dimensional x-ray beam phase sensing
S Bérujon, E Ziegler, R Cerbino, L Peverini
Physical review letters 108 (15), 158102, 2012
1972012
X-ray-scattering information obtained from near-field speckle
R Cerbino, L Peverini, MAC Potenza, A Robert, P Bösecke, M Giglio
Nature Physics 4 (3), 238-243, 2008
1362008
Development of a self-consistent free-form approach for studying the three-dimensional morphology of a thin film
IV Kozhevnikov, L Peverini, E Ziegler
Physical Review B 85 (12), 125439, 2012
662012
Characterization of a next-generation piezo bimorph X-ray mirror for synchrotron beamlines
SG Alcock, I Nistea, JP Sutter, K Sawhney, JJ Fermé, C Thellièr, ...
Journal of Synchrotron Radiation 22 (1), 10-15, 2015
452015
Roughness conformity during tungsten film growth: An in situ synchrotron x-ray scattering study
L Peverini, E Ziegler, T Bigault, I Kozhevnikov
Physical Review B 72 (4), 045445, 2005
382005
The ESRF BM05 metrology beamline: Instrumentation and performance upgrade
E Ziegler, J Hoszowska, T Bigault, L Peverini, JY Massonnat, R Hustache
AIP Conference Proceedings 705 (1), 436-439, 2004
372004
Ion beam profiling of aspherical X-ray mirrors
L Peverini, IV Kozhevnikov, A Rommeveaux, PV Vaerenbergh, L Claustre, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2010
312010
Polycrystalline Ni thin films on nanopatterned Si substrates: From highly conformal to nonconformal anisotropic growth
A Keller, L Peverini, J Grenzer, GJ Kovacs, A Mücklich, S Facsko
Physical Review B 84 (3), 035423, 2011
302011
Dynamic scaling of roughness at the early stage of tungsten film growth
L Peverini, E Ziegler, T Bigault, I Kozhevnikov
Physical Review B 76 (4), 045411, 2007
302007
Evolution of surface roughness in silicon X-ray mirrors exposed to a low-energy ion beam
E Ziegler, L Peverini, N Vaxelaire, A Cordon-Rodriguez, A Rommeveaux, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2010
282010
Asymmetric grazing incidence small angle x-ray scattering and anisotropic domain wall motion in obliquely grown nanocrystalline Co films
C Quirós, L Peverini, J Díaz, A Alija, C Blanco, M Vélez, O Robach, ...
Nanotechnology 25 (33), 335704, 2014
272014
Development of soft and hard X-ray optics for astronomy
O Citterio, P Conconi, M Ghigo, F Mazzoleni, G Pareschi, L Peverini
X-Ray Optics, Instruments, and Missions IV 4138, 43-56, 2000
232000
Exact solution of the phase problem in in situ x-ray reflectometry of a growing layered film
I Kozhevnikov, L Peverini, E Ziegler
Journal of applied physics 104 (5), 2008
182008
On‐Line Mirror Surfacing Monitored by X‐ray Shearing Interferometry and X‐ray Scattering
E Ziegler, L Peverini, IV Kozhevnikov, T Weitkamp, C David
AIP Conference Proceedings 879 (1), 778-781, 2007
182007
Exact determination of the phase in time-resolved X-ray reflectometry
I Kozhevnikov, L Peverini, E Ziegler
Optics express 16 (1), 144-149, 2008
162008
Evolution of surface morphology at the early stage of Al2O3 film growth on a rough substrate
EO Filatova, L Peverini, E Ziegler, IV Kozhevnikov, P Jonnard, JM Andre
Journal of Physics: Condensed Matter 22 (34), 345003, 2010
152010
Roughness evolution of Si surfaces upon Ar ion erosion
V de Rooij-Lohmann, IV Kozhevnikov, L Peverini, E Ziegler, R Cuerno, ...
Applied surface science 256 (16), 5011-5014, 2010
152010
Dynamic scaling in ion etching of tungsten films
L Peverini, E Ziegler, I Kozhevnikov
Applied Physics Letters 91 (5), 2007
132007
X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions
C Ferrari, F Germini, D Korytár, P Mikulík, L Peverini
Journal of Applied Crystallography 44 (2), 353-358, 2011
122011
Real‐time X‐ray reflectometry during thin‐film processing
L Peverini, I Kozhevnikov, E Ziegler
physica status solidi (a) 204 (8), 2785-2791, 2007
92007
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