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Sarah Azimi
Sarah Azimi
Assistant Professor (RTD-B) - Politecnico di Torino
Verified email at polito.it
Title
Cited by
Cited by
Year
Ultrahigh energy heavy ion test beam on Xilinx Kintex-7 SRAM-based FPGA
B Du, L Sterpone, S Azimi, DM Codinachs, V Ferlet-Cavrois, CB Polo, ...
IEEE Transactions on Nuclear Science 66 (7), 1813-1819, 2019
442019
On the reliability of convolutional neural network implementation on SRAM-based FPGA
B Du, S Azimi, C De Sio, L Bozzoli, L Sterpone
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2019
372019
SEU evaluation of hardened-by-replication software in RISC-V soft processor
C De Sio, S Azimi, A Portaluri, L Sterpone
2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2021
222021
FireNN: Neural networks reliability evaluation on hybrid platforms
C De Sio, S Azimi, L Sterpone
IEEE Transactions on Emerging Topics in Computing 10 (2), 549-563, 2022
212022
Digital design techniques for dependable high performance computing
S Azimi, L Sterpone
2020 IEEE International Test Conference (ITC), 1-10, 2020
212020
Analyzing radiation-induced transient errors on SRAM-based FPGAs by propagation of broadening effect
C De Sio, S Azimi, L Sterpone, B Du
IEEE Access 7, 140182-140189, 2019
212019
A 3-D simulation-based approach to analyze heavy ions-induced SET on digital circuits
L Sterpone, F Luoni, S Azimi, B Du
IEEE Transactions on Nuclear Science 67 (9), 2034-2041, 2020
202020
A radiation-hardened CMOS full-adder based on layout selective transistor duplication
S Azimi, C De Sio, L Sterpone
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 29 (8 …, 2021
192021
On the analysis of radiation-induced failures in the AXI interconnect module
C De Sio, S Azimi, L Sterpone
Microelectronics Reliability 114, 113733, 2020
192020
A new CAD tool for Single Event Transient Analysis and mitigation on Flash-based FPGAs
S Azimi, B Du, L Sterpone, DM Codinachs, R Grimoldi, L Cattaneo
Integration 67, 73-81, 2019
192019
On the prediction of radiation-induced SETs in flash-based FPGAs
S Azimi, B Du, L Sterpone
Microelectronics Reliability 64, 230-234, 2016
172016
An emulation platform for evaluating the reliability of deep neural networks
C De Sio, S Azimi, L Sterpone
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2020
162020
Radiation-induced Single Event Transient effects during the reconfiguration process of SRAM-based FPGAs
C De Sio, S Azimi, L Bozzoli, B Du, L Sterpone
Microelectronics Reliability 100, 113342, 2019
162019
On the analysis of radiation-induced Single Event Transients on SRAM-based FPGAs
S Azimi, L Sterpone, B Du, L Boragno
Microelectronics Reliability 88, 936-940, 2018
162018
A selective mapper for the mitigation of SETs on rad-hard RTG4 flash-based FPGAs
L Sterpone, S Azimi, B Du
2016 16th European Conference on Radiation and Its Effects on Components and …, 2016
162016
A Novel Error Rate Estimation Approach forUltraScale+ SRAM-based FPGAs
L Sterpone, S Azimi, L Bozzoli, B Du, T Lange, M Glorieux, ...
2018 NASA/ESA Conference on Adaptive Hardware and Systems (AHS), 120-126, 2018
152018
Evaluation of transient errors in GPGPUs for safety critical applications: An effective simulation-based fault injection environment
S Azimi, B Du, L Sterpone
Journal of Systems Architecture 75, 95-106, 2017
152017
Analysis of single event effects on embedded processor
S Azimi, C De Sio, D Rizzieri, L Sterpone
Electronics 10 (24), 3160, 2021
142021
Radiation-induced single event transients modeling and testing on nanometric flash-based technologies
L Sterpone, B Du, S Azimi
Microelectronics Reliability 55 (9-10), 2087-2091, 2015
132015
A comparative radiation analysis of reconfigurable memory technologies: FinFET versus bulk CMOS
S Azimi, C De Sio, A Portaluri, D Rizzieri, L Sterpone
Microelectronics Reliability 138, 114733, 2022
122022
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