| Proof of reverse engineering barrier: sem image analysis on covert gates T Farheen, U Botero, N Varshney, DL Woodard, M Tehranipoor, D Forte, ... ISTFA 2021, 179-189, 2021 | 9 | 2021 |
| He-ion Beam Imaging for Accurate Hardware Trojan Detection NA Nitin Varshney, Haoting Shen, Olivia Paradis Microscopy and Microanalysis, 1-3, 2020 | 9* | 2020 |
| iprobe: Internal shielding approach for protecting against front-side and back-side probing attacks M Gao, MS Rahman, N Varshney, M Tehranipoor, D Forte IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2023 | 8 | 2023 |
| Hardware deprocessing using voltage imaging for hardware assurance MM Tehranipoor, N Asadi-Zanjani, OP Paradis, N Varshney US Patent 11,604,912, 2023 | 6 | 2023 |
| LLE: Mitigating IC Piracy and Reverse Engineering by Last Level Edit S Rahman, N Varshney, F Farahmandi, N Asadi Zanjani, M Tehranipoor ISTFA 2023, 360-369, 2023 | 3 | 2023 |
| US Microelectronics Packaging Ecosystem: Challenges and Opportunities R Noor, HR Kottur, PJ Craig, LK Biswas, MSM Khan, N Varshney, H Dalir, ... arXiv preprint arXiv:2310.11651, 2023 | 3 | 2023 |
| Electron Beam Probing: The New Sheriff in Town for Security Analyzing of Sub-7nm ICs-Exploring the Advantages of a Post-Photon Emission Technique N Varshney, C Xi, AA Khan, LK Biswas, V Sorger, H Dalir, N Asadizanjani ISTFA 2023, 346-351, 2023 | 2 | 2023 |
| DeepICLogo: A Novel Benchmark Dataset for Deep Learning-Based IC Logo Detection S Ghosh, P Craig, J Julia, N Varshney, H Dalir, N Asadizanjani 2023 IEEE Physical Assurance and Inspection of Electronics (PAINE), 2023 | 1 | 2023 |
| From Talent Shortage to Workforce Excellence in the CHIPS Act Era: Harnessing Industry 4.0 Paradigms for a Sustainable Future in Domestic Chip Production AD Rizi, A Roy, R Noor, H Kang, N Varshney, K Jacob, S Rivera-Jimenez, ... arXiv preprint arXiv:2308.00215, 2023 | 1 | 2023 |
| In-Situ Thickness Measurement of Die Silicon Using Voltage Imaging for Hardware Assurance OP Dizon-Paradis, N Varshney, MT Rahman, M Strizich, H Shen, ... arXiv preprint arXiv:2307.13118, 2023 | 1 | 2023 |
| Security Challenges for Assurance in Silicon Photonic Packaging LK Biswas, AA Aslam, YK Yoon, N Asadizanjani, N Varshney, V Sorger, ... 2023 IEEE Research and Applications of Photonics in Defense Conference (RAPID), 2023 | 1 | 2023 |
| THz-TDS for IC packaging material changes detection under real-world conditions C Xi, N Varshney, MSM Khan, H Dalir, N Asadizanjani Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and …, 2024 | | 2024 |
| Enhancing counterfeit detection of integrated circuits through machine learning-assisted THz-TDS analysis C Xi, N Varshney, MSM Khan, H Dalir, N Asadizanjani Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and …, 2024 | | 2024 |
| Physical assurance for photonics devices LK Biswas, N Varshney, V Sorger, H Dalir, N Asadizanjani Photonic Instrumentation Engineering XI 12893, 309-317, 2024 | | 2024 |
| INSPECT: Investigating Supply Chain and Cyber-Physical Security of Battery Systems T Zhang, S Shi, MH Rahman, N Varshney, A Kulkarni, F Farahmandi, ... Cryptology ePrint Archive, 2024 | | 2024 |
| Exploring the Effect of Annotation Quality on PCB Component Segmentation MMA Hasan, N Jessurun, N Varshney, N Asadizanjani ISTFA 2023, 136-144, 2023 | | 2023 |
| : An X-Ray Compatibility Metric for Advanced Packages to Facilitate Design-for-Inspection MSM Khan, C Xi, N Varshney, AA Khan, A Serna, H Dalir, V Sorger, ... 2023 IEEE Physical Assurance and Inspection of Electronics (PAINE), 1-7, 2023 | | 2023 |
| From Talent Shortage to Workforce Excellence in the CHIPS Act Era: Harnessing Industry 4.0 Paradigms for a Sustainable Future in Domestic Chip Production A Damanpak Rizi, A Roy, R Noor, H Kang, N Varshney, K Jacob, ... arXiv e-prints, arXiv: 2308.00215, 2023 | | 2023 |
| Disposable micro stir bars by photodegradable organic encapsulation of hematite–magnetite nanoparticles T Zhang, P Costigan, N Varshney, A Tricoli RSC advances 6 (40), 33843-33850, 2016 | | 2016 |
Mark M. TehranipoorIntel Charles E. Young Endowed Chair Professor, ECE, University of FloridaVerified email at ufl.edu
