Carsten Steger

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Markus UlrichKarlsruhe Institute of Technology (KIT)Verified email at kit.edu
Helmut MayerBundeswehr University Munich, Professor of Visual ComputingVerified email at unibw.de
Paul BergmannDeep Learning Engineer at AppleVerified email at apple.com
David SattleggerResearch Engineer, MVTec Software GmbHVerified email at mvtec.com
Bernd RadigTechnical University of MunichVerified email at in.tum.de
Sindy LöweCuspAIVerified email at cusp.ai
Kilian Obermeier (Batzner)AppleVerified email at apple.com
Ivan LaptevProfessor at MBZUAI, on leave from INRIAVerified email at inria.fr
Nassir NavabProfessor of Computer Science, Technische Universität MünchenVerified email at cs.tum.edu
Christian HeipkeProfessor in photogrammetry and remote sensing, Leibniz Universität Hannover, GermanyVerified email at ipi.uni-hannover.de
Bertram DrostTU MünchenVerified email at in.tum.de
Tony LindebergProfessor of Computer Science - Computational Vision, KTH Royal Institute of TechnologyVerified email at kth.se
Philipp HärtingerMVTec Software GmbHVerified email at mvtec.com
Stefan HinzKIT Karlsruhe, Technische Universität MuenchenVerified email at kit.edu
Charles R. DyerProfessor of Computer Science, University of Wisconsin - MadisonVerified email at cs.wisc.edu
X. JinKarlsruhe Institute of TechnologyVerified email at student.kit.edu
Tobias BöttgerPhD Student, MVTec Software GmbHVerified email at mvtec.com
Federico TombariGoogle, TU MunichVerified email at in.tum.de
Kostas BekrisProfessor of Computer Science, Rutgers UniversityVerified email at cs.rutgers.edu
Caner SahinIstanbul Medeniyet University, GemsasVerified email at medeniyet.edu.tr

Carsten Steger

Director of Research, MVTec Software GmbH, and Professor of Computer Science, TU München

Verified email at in.tum.de

Machine Vision Computer Vision Photogrammetry


Title Sort by citations Sort by year Sort by title	Cited by Cited by	Year
An unbiased detector of curvilinear structures C Steger IEEE Transactions on Pattern Analysis and Machine Intelligence 20 (2), 113-125, 1998	1792	1998
MVTec AD - A Comprehensive Real-World Dataset for Unsupervised Anomaly Detection P Bergmann, M Fauser, D Sattlegger, C Steger IEEE/CVF Conference on Computer Vision and Pattern Recognition, 9592-9600, 2019	1647	2019
Machine vision algorithms and applications C Steger, M Ulrich, C Wiedemann Wiley-VCH, 2008	968*	2008
Improving Unsupervised Defect Segmentation by Applying Structural Similarity to Autoencoders P Bergmann, S Löwe, M Fauser, D Sattlegger, C Steger 14th International Joint Conference on Computer Vision, Imaging and Computer …, 2019	791	2019
Uninformed students: Student-teacher anomaly detection with discriminative latent embeddings P Bergmann, M Fauser, D Sattlegger, C Steger IEEE/CVF Conference on Computer Vision and Pattern Recognition, 4183-4192, 2020	764	2020
Machine vision algorithms C Steger Handbook of Machine Vision, 511-692, 2006	418*	2006
Automatic extraction of roads from aerial images based on scale space and snakes I Laptev, H Mayer, T Lindeberg, W Eckstein, C Steger, A Baumgartner Machine Vision and Applications 12 (1), 23-31, 2000	395	2000
The MVTec Anomaly Detection Dataset: A Comprehensive Real-World Dataset for Unsupervised Anomaly Detection P Bergmann, K Batzner, M Fauser, D Sattlegger, C Steger International Journal of Computer Vision 129 (4), 1038-1059, 2021	368	2021
Automatic road extraction based on multi-scale, grouping, and context A Baumgartner, C Steger, H Mayer, W Eckstein, H Ebner Photogrammetric Engineering and Remote Sensing 65 (7), 777-786, 1999	300	1999
Occlusion, clutter, and illumination invariant object recognition C Steger International Archives of Photogrammetry Remote Sensing 34 (Part 3A), 345-350, 2002	181	2002
Techniques for a structural analysis of dermatoscopic imagery MG Fleming, C Steger, J Zhang, J Gao, AB Cognetta, CR Dyer Computerized medical imaging and graphics 22 (5), 375-389, 1998	176	1998
Combining scale-space and similarity-based aspect graphs for fast 3D object recognition M Ulrich, C Wiedemann, C Steger IEEE Transactions on Pattern Analysis and Machine Intelligence 34 (10), 1902 …, 2012	168	2012
Introducing MVTec ITODD - A Dataset for 3D Object Recognition in Industry B Drost, M Ulrich, P Bergmann, P Härtinger, C Steger International Conference on Computer Vision, 2200-2208, 2017	167	2017
CAD-based recognition of 3D objects in monocular images M Ulrich, C Wiedemann, C Steger International Conference on Robotics and Automation, 1191-1198, 2009	151	2009
Extracting curvilinear structures: A differential geometric approach C Steger Fourth European Conference on Computer Vision, 630-641, 1996	151	1996
机器视觉算法与应用 (Machine vision algorithms and applications) C Steger, M Ulrich, C Wiedemann 清华大学出版社 (Tsinghua University Press), 2008	138*	2008
Beyond Dents and Scratches: Logical Constraints in Unsupervised Anomaly Detection and Localization P Bergmann, K Batzner, M Fauser, D Sattlegger, C Steger International Journal of Computer Vision 130 (4), 947-969, 2022	136	2022
System and method for 3D object recognition C Wiedemann, M Ulrich, C Steger US Patent 8,379,014, 2013	130	2013
The MVTec 3D-AD Dataset for Unsupervised 3D Anomaly Detection and Localization P Bergmann, X Jin, D Sattlegger, C Steger 17th International Joint Conference on Computer Vision, Imaging and Computer …, 2022	128	2022
Similarity measures for occlusion, clutter, and illumination invariant object recognition C Steger Pattern Recognition, 148-154, 2001	123	2001

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