Yixin Luo
Title
Cited by
Cited by
Year
RowClone: Fast and energy-efficient in-DRAM bulk data copy and initialization
V Seshadri, Y Kim, C Fallin, D Lee, R Ausavarungnirun, G Pekhimenko, ...
Proceedings of the 46th Annual IEEE/ACM International Symposium on …, 2013
2952013
Data retention in MLC NAND flash memory: Characterization, optimization, and recovery
Y Cai, Y Luo, EF Haratsch, K Mai, O Mutlu
2015 IEEE 21st International Symposium on High Performance Computer …, 2015
2212015
Computational sprinting
A Raghavan, Y Luo, A Chandawalla, M Papaefthymiou, KP Pipe, ...
IEEE international symposium on high-performance comp architecture, 1-12, 2012
2072012
Error characterization, mitigation, and recovery in flash-memory-based solid-state drives
Y Cai, S Ghose, EF Haratsch, Y Luo, O Mutlu
Proceedings of the IEEE 105 (9), 1666-1704, 2017
1732017
Read disturb errors in MLC NAND flash memory: Characterization, mitigation, and recovery
Y Cai, Y Luo, S Ghose, EF Haratsch, K Mai, O Mutlu
2015 45th Annual IEEE/IFIP International Conference on Dependable Systems …, 2015
1572015
Characterizing application memory error vulnerability to optimize datacenter cost via heterogeneous-reliability memory
Y Luo, S Govindan, B Sharma, M Santaniello, J Meza, A Kansal, J Liu, ...
2014 44th Annual IEEE/IFIP International Conference on Dependable Systems …, 2014
1572014
Vulnerabilities in MLC NAND flash memory programming: Experimental analysis, exploits, and mitigation techniques
Y Cai, S Ghose, Y Luo, K Mai, O Mutlu, EF Haratsch
2017 IEEE International Symposium on High Performance Computer Architecture …, 2017
1052017
A case for efficient hardware/software cooperative management of storage and memory
J Meza, Y Luo, S Khan, J Zhao, Y Xie, O Mutlu
Carnegie Mellon University, 2013
1042013
WARM: Improving NAND flash memory lifetime with write-hotness aware retention management
Y Luo, Y Cai, S Ghose, J Choi, O Mutlu
2015 31st Symposium on Mass Storage Systems and Technologies (MSST), 1-14, 2015
1032015
HeatWatch: Improving 3D NAND flash memory device reliability by exploiting self-recovery and temperature awareness
Y Luo, S Ghose, Y Cai, EF Haratsch, O Mutlu
2018 IEEE International Symposium on High Performance Computer Architecture …, 2018
712018
Enabling accurate and practical online flash channel modeling for modern MLC NAND flash memory
Y Luo, S Ghose, Y Cai, EF Haratsch, O Mutlu
IEEE Journal on Selected Areas in Communications 34 (9), 2294-2311, 2016
532016
Improving 3D NAND flash memory lifetime by tolerating early retention loss and process variation
Y Luo, S Ghose, Y Cai, EF Haratsch, O Mutlu
Proceedings of the ACM on Measurement and Analysis of Computing Systems 2 (3 …, 2018
522018
Errors in flash-memory-based solid-state drives: Analysis, mitigation, and recovery
Y Cai, S Ghose, EF Haratsch, Y Luo, O Mutlu
arXiv preprint arXiv:1711.11427, 2017
492017
Improving the reliability of chip-off forensic analysis of NAND flash memory devices
A Fukami, S Ghose, Y Luo, Y Cai, O Mutlu
Digital Investigation 20, S1-S11, 2017
392017
A case for unlimited watchpoints
JL Greathouse, H Xin, Y Luo, T Austin
ACM SIGPLAN Notices 47 (4), 159-172, 2012
382012
FLIN: Enabling fairness and enhancing performance in modern NVMe solid state drives
A Tavakkol, M Sadrosadati, S Ghose, J Kim, Y Luo, Y Wang, NM Ghiasi, ...
2018 ACM/IEEE 45th Annual International Symposium on Computer Architecture …, 2018
372018
Designing for responsiveness with computational sprinting
A Raghavan, Y Luo, A Chandawalla, M Papaefthymiou, KP Pipe, ...
Ieee Micro 33 (3), 8-15, 2013
162013
Reliability issues in flash-memory-based solid-state drives: Experimental analysis, mitigation, recovery
Y Cai, S Ghose, EF Haratsch, Y Luo, O Mutlu
Inside Solid State Drives (SSDs), 233-341, 2018
112018
Random forests and VGG-NET: an algorithm for the ISIC 2017 skin lesion classification challenge
S Guo, Y Luo, Y Song
arXiv preprint arXiv:1703.05148, 2017
112017
Using ECC DRAM to adaptively increase memory capacity
Y Luo, S Ghose, T Li, S Govindan, B Sharma, B Kelly, A Boroumand, ...
arXiv preprint arXiv:1706.08870, 2017
102017
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