| Raman and photocurrent imaging of electrical stress-induced p–n junctions in graphene G Rao, M Freitag, HY Chiu, RS Sundaram, P Avouris ACS nano 5 (7), 5848-5854, 2011 | 89 | 2011 |
| Electromechanical robustness of monolayer graphene with extreme bending BD Briggs, B Nagabhirava, G Rao, R Geer, H Gao, Y Xu, B Yu Applied Physics Letters 97 (22), 2010 | 63 | 2010 |
| Study of electron beam irradiation induced defectivity in mono and bi layer graphene and the influence on raman band position and line-width G Rao, S Mactaggart, JU Lee, R Geer MRS Online Proceedings Library (OPL) 1184, 1184-HH03-07, 2009 | 5 | 2009 |
| Effects of low energy E-beam irradiation on graphene and graphene field effect transistors and raman metrology of graphene on split gate test structures GS Rao State University of New York at Albany, 2011 | 2 | 2011 |
| Characterization of Nano‐Scale Graphene Devices for Thickness and Defect Metrology Using Micro and Nano‐Raman Spectroscopy G Rao, S McTaggart, JU Lee, RE Geer AIP Conference Proceedings 1173 (1), 139-142, 2009 | 1 | 2009 |
| Study of defectivity in suspended graphene by analysis of G-phonon Raman line-widths G Rao, JU Lee, R Geer APS March Meeting Abstracts 2010, W20. 003, 2010 | | 2010 |
| Defectivity evolution in electron-irradiated mono and bi-layer graphene G Rao, S McTaggart, R Geer, JU Lee ECS Meeting Abstracts, 1298, 2009 | | 2009 |
| Effect of substrate engineering of AlN/Si (111) substrates on overgrown GaN films M Tungare, N Tripathi, V Jindal, G Rao, R Geer, F Shahedipour-Sandvik | | |
Hsin-Ying ChiuFacebook IncVerified email at fb.com
