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Aluguri Rakesh
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Metal oxide resistive switching memory: materials, properties and switching mechanisms
D Kumar, R Aluguri, U Chand, TY Tseng
Ceramics International 43, S547-S556, 2017
1322017
Enhancement of resistive switching properties in nitride based CBRAM device by inserting an Al2O3 thin layer
D Kumar, R Aluguri, U Chand, TY Tseng
Applied Physics Letters 110 (20), 2017
762017
Optical and electrical properties of undoped and doped Ge nanocrystals
S Das, R Aluguri, S Manna, R Singha, A Dhar, L Pavesi, SK Ray
Nanoscale research letters 7, 1-11, 2012
472012
Dielectric and transport properties of carbon nanotube-CdS nanostructures embedded in polyvinyl alcohol matrix
SP Mondal, R Aluguri, SK Ray
Journal of Applied Physics 105 (11), 2009
452009
Fast, Highly Flexible, and Transparent TaOx-Based Environmentally Robust Memristors for Wearable and Aerospace Applications
S Rajasekaran, FM Simanjuntak, D Panda, S Chandrasekaran, R Aluguri, ...
ACS Applied Electronic Materials 2 (10), 3131-3140, 2020
342020
One bipolar selector-one resistor for flexible crossbar memory applications
D Kumar, R Aluguri, U Chand, TY Tseng
IEEE Transactions on Electron Devices 66 (3), 1296-1301, 2019
312019
One bipolar transistor selector-One resistive random access memory device for cross bar memory array
R Aluguri, D Kumar, FM Simanjuntak, TY Tseng
AIP Advances 7 (9), 2017
312017
Multilayer Ge nanocrystals embedded within Al2O3 matrix for high performance floating gate memory devices
R Bar, R Aluguri, S Manna, A Ghosh, PV Satyam, SK Ray
Applied Physics Letters 107 (9), 2015
312015
Optical photoresponse of CuS–n-Si radial heterojunction with Si nanocone arrays fabricated by chemical etching
AK Katiyar, AK Sinha, S Manna, R Aluguri, SK Ray
Physical Chemistry Chemical Physics 15 (48), 20887-20893, 2013
292013
The impact of TiW barrier layer thickness dependent transition from electro-chemical metallization memory to valence change memory in ZrO2-based resistive switching random …
S Chandrasekaran, FM Simanjuntak, R Aluguri, TY Tseng
Thin Solid Films 660, 777-781, 2018
282018
Conductive bridge random access memory characteristics of SiCN based transparent device due to indium diffusion
D Kumar, R Aluguri, U Chand, TY Tseng
Nanotechnology 29 (12), 125202, 2018
282018
Temperature dependent photoluminescence and electroluminescence characteristics of core-shell Ge–GeO2 nanowires
S Manna, A Katiyar, R Aluguri, SK Ray
Journal of Physics D: Applied Physics 48 (21), 215103, 2015
212015
Characteristics of flexible and transparent Eu2O3 resistive switching memory at high bending condition
R Aluguri, R Sailesh, D Kumar, TY Tseng
Nanotechnology 30 (4), 045202, 2018
172018
Size dependent charge storage characteristics of MBE grown Ge nanocrystals on surface oxidized Si
R Aluguri, S Das, RK Singha, SK Ray
Current applied physics 13 (1), 12-17, 2013
152013
Enhancement of photoluminescence intensity of erbium doped silica containing Ge nanocrystals: distance dependent interactions
S Manna, R Aluguri, R Bar, S Das, N Prtljaga, L Pavesi, SK Ray
Nanotechnology 26 (4), 045202, 2015
142015
Effect of growth temperature and post-growth annealing on luminescence properties of molecular beam epitaxy grown single layer Ge quantum dots
S Das, S Manna, RK Singha, R Aluguri, SK Ray
Journal of Applied Physics 113 (6), 2013
112013
Role of Al2O3 thin layer on improving the resistive switching properties of Ta5Si3-based conductive bridge random accesses memory device
D Kumar, R Aluguri, U Chand, TY Tseng
Japanese Journal of Applied Physics 57 (4S), 04FE16, 2018
92018
MBE-grown Si and Si1− xGex quantum dots embedded within epitaxial Gd2O3 on Si (111) substrate for floating gate memory device
S Manna, R Aluguri, A Katiyar, S Das, A Laha, HJ Osten, SK Ray
Nanotechnology 24 (50), 505709, 2013
92013
Direct band gap optical emission from compressively strained Ge films grown on relaxed Si0. 5Ge0. 5 substrate
R Aluguri, S Manna, SK Ray
Applied Physics Letters 103 (16), 2013
82013
Photoluminescence characteristics of Er doped Ge nanocrystals embedded in alumina matrix
R Aluguri, S Das, S Manna, RK Singha, SK Ray
Optical Materials 34 (8), 1430-1433, 2012
82012
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