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Moyra McManus
Moyra McManus
BlueGene/Q System Bringup Lead, IBM Research
Verified email at us.ibm.com
Title
Cited by
Cited by
Year
Testing and diagnostics of CMOS circuits using light emission from off-state leakage current
F Stellari, P Song, JC Tsang, MK McManus, MB Ketchen
IEEE transactions on electron devices 51 (9), 1455-1462, 2004
732004
Picosecond imaging circuit analysis of leakage currents in CMOS circuits
S Polonsky, A Weger, M McManus
ISTFA 2002, 387-390, 2002
542002
Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs
K Chatty, P Cottrell, R Gauthier, M Muhammad, F Stellari, A Weger, ...
2004 IEEE International Reliability Physics Symposium. Proceedings, 130-134, 2004
472004
Diagnosis and characterization of timing-related defects by time-dependent light emission
D Knebel, P Sanda, M McManus, JA Kash, JC Tsang, D Vallett, ...
Proceedings International Test Conference 1998 (IEEE Cat. No. 98CH36270 …, 1998
461998
Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latchup
A Weger, S Voldman, F Stellari, P Song, P Sanda, M McManus
2003 IEEE International Reliability Physics Symposium Proceedings, 2003 …, 2003
372003
Diagnostic techniques for the IBM S/390 600 MHz G5 microprocessor
P Song, F Motika, D Knebel, R Rizzolo, M Kusko, J Lee, M McManus
International Test Conference 1999. Proceedings (IEEE Cat. No. 99CH37034 …, 1999
331999
The attack of the" Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA)
W Huott, M McManus, D Knebel, S Steen, D Manzer, P Sanda, S Wilson, ...
International Test Conference 1999. Proceedings (IEEE Cat. No. 99CH37034 …, 1999
291999
Circuit voltage probe based on time-integrated measurements of optical emission from leakage current
F Stellari, P Song, JC Tsang, MK McManus, MB Ketchen
ISTFA 2002, 667-672, 2002
282002
Optical diagnosis of excess IDDQ in low power CMOS circuits
F Stellari, P Song, JC Tsang, MK McManus, MB Ketchen
Microelectronics Reliability 42 (9-11), 1689-1694, 2002
262002
Time-resolved optical measurements from 0.13 μm CMOS technology microprocessor using a Superconducting Single-Photon Detector
F Stellari, P Song, AJ Weger, MK McManus
ISTFA 2003, 40-44, 2003
222003
Picosecond imaging circuit analysis of the IBM G6 microprocessor cache
M McManus, P Sanda, S Steen, D Knebel, D Manzer, S Polonsky, B Huott, ...
ISTFA 1999, 35-38, 1999
191999
Study of critical factors determining latchup sensitivity of ICs using emission microscopy
F Stellari, P Song, MK McManus, AJ Weger, RJ Gauthier, KV Chatty, ...
ISTFA 2003, 19-24, 2003
142003
Non-invasive timing analysis of IBM G6 microprocessor L1 cache using backside time-resolved hot electron luminescence
S Polonsky, D Knebel, P Sanda, M McManus, W Huott, A Pelella, ...
2000 IEEE International Solid-State Circuits Conference. Digest of Technical …, 2000
132000
Power and performance sorting of microprocessors from first interconnect layer to wafer final test
E Acar, MK McManus, SR Nassif, MJ Sullivan
US Patent 10,474,774, 2019
102019
Testing and operating a multiprocessor chip with processor redundancy
RE Bellofatto, SM Douskey, RA Haring, MK McManus, M Ohmacht, ...
US Patent 8,868,975, 2014
102014
System and method for spatial, temporal, energy-resolving detection of single photons
SV Polonsky, RH Koch, MK McManus
US Patent 7,078,694, 2006
102006
An advanced optical diagnostic technique of IBM z990 eServer microprocessor
P Song, F Stellari, B Huott, O Wagner, U Srinivasan, Y Chan, R Rizzolo, ...
IEEE International Conference on Test, 2005., 9 pp.-1235, 2005
102005
An advanced optical diagnostic technique for IBM microprocessor
P Song, F Stellari, B Huott, O Wagner, U Srinivasan, Y Chan, R Rizzolo, ...
Proc. of International Test Conference (ITC), 48.1-48.9, 2005
102005
Design for low power and power management in IBM Blue Gene/Q
K Sugavanam, CY Cher, JA Gunnels, RA Haring, P Heidelberger, ...
IBM Journal of Research and Development 57 (1/2), 3: 1-3: 11, 2013
92013
Design of the IBM Blue Gene/Q compute chip
RA Haring
IBM Journal of Research and Development 57 (1), 1-12, 2013
92013
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