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Coauteurs
- Minghao QiPurdue UniversityAdresse e-mail validée de purdue.edu
- Andrew M. WeinerProfessor of Electrical and Computer Engineering, Purdue UniversityAdresse e-mail validée de purdue.edu
- Yi XUANUniversity of Pittsburgh, School of MedicineAdresse e-mail validée de pitt.edu
- Sangsik KimAssociate Professor of Electrical Engineering, Korea Advanced Institute of Science and TechnologyAdresse e-mail validée de kaist.ac.kr
- Jose Jaramillo-VillegasPurdue University, Universidad Tecnológica de PereiraAdresse e-mail validée de utp.edu.co
- Min TengimecAdresse e-mail validée de imec-int.com
- Abdullah Al NomanFailure Analysis R&D Engineer at Intel CorporationAdresse e-mail validée de intel.com
- Victor YurlovPrincipal Engineer of Samsung Electromechanics (Optics, MEMS, ISP)Adresse e-mail validée de samsung.com
- Vladimir A. AksyukProject Leader, Physical Measurement Laboratory, NISTAdresse e-mail validée de nist.gov
- Thomas LeBrunGroup Leader for Photonics and Optomechanics, NISTAdresse e-mail validée de nist.gov
- Junyeob SongNational Institute of Standards and Technology & University of DelawareAdresse e-mail validée de NIST.GOV
- David LongNational Institute of Standards and TechnologyAdresse e-mail validée de nist.gov
- Nan Ei Yu (N. E. Yu)Gwngju Institute of Science and Technology (GIST)Adresse e-mail validée de gist.ac.kr