chenming hu

Cited by

	All	Since 2018
Citations	80863	17413
h-index	142	63
i10-index	921	346

3700

1850

925

2775

1987198819891990199119921993199419951996199719981999200020012002200320042005200620072008200920102011201220132014201520162017201820192020202120222023211 307 425 463 477 612 874 841 931 1099 1149 1339 1396 1439 1800 1794 2127 2482 2794 3081 3179 3086 2914 3089 3156 3096 3603 3635 3428 3671 3535 3483 3124 3036 3297 3198 1272

Public access

View all

26 articles

29 articles

available

not available

Based on funding mandates

Co-authors

Tsu-Jae King LiuUniversity of CaliforniaVerified email at eecs.berkeley.edu
Yee-Chia YeoNational University of SingaporeVerified email at nus.edu.sg
Leland ChangIBMVerified email at us.ibm.com
Jeffrey Bokor Professor of electrical engineering and computer sciences, University of California, BerkeleyVerified email at eecs.berkeley.edu
Sayeef SalahuddinTSMC Distinguished Professor of EECS, University of California, BerkeleyVerified email at berkeley.edu
Mansun ChanChair Professor, HKUSTVerified email at ust.hk
Ali M NIKNEJADUC BerkeleyVerified email at berkeley.edu
Yang-Kyu ChoiProfessor of Electrical Engineering, KAISTVerified email at ee.kaist.ac.kr
Juan Pablo Duarte SepulvedaAppleVerified email at apple.com
AssaderaghiSiTimeVerified email at sitime.com
Dennis SylvesterProfessor of Electrical Engineering and Computer Science, University of MichiganVerified email at umich.edu
Hideki TakeuchiAtomeraVerified email at atomera.com
Darsen LuNCKUVerified email at cal.berkeley.edu
Jin HePeking universityVerified email at pku.edu.cn
Michael OrshanskyUniversity of Texas at AustinVerified email at austin.utexas.edu
Vivek SubramanianEcole polytechnique Federale de Lausanne (EPFL)Verified email at epfl.ch
Yu CaoProfessor of Electrical Engineering, Arizona State UniversityVerified email at asu.edu
Pin SuNational Chiao Tung UniversityVerified email at faculty.nctu.edu.tw
Sriramkumar VenugopalanSemiconductors ProfessionalVerified email at eecs.berkeley.edu
Kaustav BanerjeeUC Santa Barbara, Stanford University, UC BerkeleyVerified email at ece.ucsb.edu

chenming hu

University of California, Berkeley

Verified email at eecs.berkeley.edu - Homepage

engineering


Title Sort by citations Sort by year Sort by title	Cited by Cited by	Year
FinFET-a self-aligned double-gate MOSFET scalable to 20 nm D Hisamoto, WC Lee, J Kedzierski, H Takeuchi, K Asano, C Kuo, ... IEEE transactions on electron devices 47 (12), 2320-2325, 2000	2247	2000
Hot-electron-induced MOSFET degradation-model, monitor, and improvement C Hu, SC Tam, FC Hsu, PK Ko, TY Chan, KW Terrill IEEE Journal of Solid-State Circuits 20 (1), 295-305, 1985	1904	1985
MoS2 transistors with 1-nanometer gate lengths SB Desai, SR Madhvapathy, AB Sachid, JP Llinas, Q Wang, GH Ahn, ... Science 354 (6308), 99-102, 2016	1215	2016
A unified model for the flicker noise in metal-oxide-semiconductor field-effect transistors KK Hung, PK Ko, C Hu, YC Cheng IEEE Transactions on Electron Devices 37 (3), 654-665, 1990	1029	1990
Sub 50-nm finfet: Pmos X Huang, WC Lee, C Kuo, D Hisamoto, L Chang, J Kedzierski, ... International Electron Devices Meeting 1999. Technical Digest (Cat. No …, 1999	817	1999
FinFET scaling to 10 nm gate length B Yu, L Chang, S Ahmed, H Wang, S Bell, CY Yang, C Tabery, C Ho, ... Digest. International Electron Devices Meeting,, 251-254, 2002	816	2002
Modern semiconductor devices for integrated circuits C Hu Prentice Hall 2, 9-24, 2010	790	2010
New paradigm of predictive MOSFET and interconnect modeling for early circuit simulation Y Cao, T Sato, M Orshansky, D Sylvester, C Hu Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No …, 2000	710	2000
Hole injection SiO/sub 2/breakdown model for very low voltage lifetime extrapolation KF Schuegraf, C Hu IEEE transactions on electron devices 41 (5), 761-767, 1994	697	1994
Finfet transistor structures having a double gate channel extending vertically from a substrate and methods of manufacture C Hu, TJ King, V Subramanian, L Chang, X Huang, YK Choi, ... US Patent 6,413,802, 2002	682	2002
Electrical breakdown in thin gate and tunneling oxides IC Chen, SE Holland, C Hu IEEE journal of Solid-state Circuits 20 (1), 333-342, 1985	638	1985
MOS capacitance measurements for high-leakage thin dielectrics KJ Yang, C Hu IEEE Transactions on Electron Devices 46 (7), 1500-1501, 1999	631	1999
MOSFET modeling & BSIM3 user’s guide Y Cheng, C Hu Springer Science & Business Media, 1999	618	1999
Sub-50 nm P-channel FinFET X Huang, WC Lee, C Kuo, D Hisamoto, L Chang, J Kedzierski, ... IEEE Transactions on Electron Devices 48 (5), 880-886, 2001	605	2001
Dynamic threshold-voltage MOSFET (DTMOS) for ultra-low voltage VLSI F Assaderaghi, D Sinitsky, SA Parke, J Bokor, PK Ko, C Hu IEEE Transactions on Electron Devices 44 (3), 414-422, 1997	603	1997
Lucky-electron model of channel hot-electron injection in MOSFET's S Tam, PK Ko, C Hu IEEE transactions on electron devices 31 (9), 1116-1125, 1984	581	1984
Threshold voltage model for deep-submicrometer MOSFETs ZH Liu, C Hu, JH Huang, TY Chan, MC Jeng, PK Ko, YC Cheng IEEE Transactions on electron devices 40 (1), 86-95, 1993	572	1993
Metal-dielectric band alignment and its implications for metal gate complementary metal-oxide-semiconductor technology YC Yeo, TJ King, C Hu Journal of applied physics 92 (12), 7266-7271, 2002	539	2002
Immersion fluid for immersion lithography, and method of performing immersion lithography YC Yeo, BJ Lin, C Hu US Patent 7,700,267, 2010	536	2010
Frequency-independent equivalent-circuit model for on-chip spiral inductors Y Cao, RA Groves, X Huang, ND Zamdmer, JO Plouchart, RA Wachnik, ... IEEE Journal of solid-state circuits 38 (3), 419-426, 2003	515	2003

The system can't perform the operation now. Try again later.

Articles 1–20

Citations per year

Duplicate citations

Merged citations

Add co-authorsCo-authors

Follow

Cited by

Co-authors