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Albert Theuwissen
Albert Theuwissen
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Verified email at harvestimaging.com - Homepage
Title
Cited by
Cited by
Year
Solid-state imaging with charge-coupled devices
AJ Theuwissen
Springer Science & Business Media, 2006
5322006
CMOS image sensors: State-of-the-art
AJP Theuwissen
Solid-State Electronics 52 (9), 1401-1406, 2008
2262008
An image sensor which captures 100 consecutive frames at 1000000 frames/s
TG Etoh, D Poggemann, G Kreider, H Mutoh, AJP Theuwissen, ...
IEEE Transactions on electron devices 50 (1), 144-151, 2003
2032003
Multiple-ramp column-parallel ADC architectures for CMOS image sensors
MF Snoeij, AJP Theuwissen, KAA Makinwa, JH Huijsing
IEEE Journal of Solid-State Circuits 42 (12), 2968-2977, 2007
1982007
Single-photon imaging
P Seitz, AJP Theuwissen
Springer Science & Business Media, 2011
1572011
Leakage current modeling of test structures for characterization of dark current in CMOS image sensors
NV Loukianova, HO Folkerts, JPV Maas, DWE Verbugt, AJ Mierop, ...
IEEE Transactions on Electron Devices 50 (1), 77-83, 2003
1362003
Random telegraph signal in CMOS image sensor pixels
X Wang, PR Rao, A Mierop, AJP Theuwissen
2006 International Electron Devices Meeting, 1-4, 2006
1272006
A CCD image sensor of 1 Mframes/s for continuous image capturing 103 frames
TG Etoh, D Poggemann, A Ruckelshausen, A Theuwissen, G Kreider, ...
2002 IEEE International Solid-State Circuits Conference. Digest of Technical …, 2002
1232002
CMOS image sensors: State-of-the-art and future perspectives
A Theuwissen
ESSDERC 2007-37th European Solid State Device Research Conference, 21-27, 2007
1052007
A 0.7erms-temporal-readout-noise CMOS image sensor for low-light-level imaging
Y Chen, Y Xu, Y Chae, A Mierop, X Wang, A Theuwissen
2012 IEEE International Solid-State Circuits Conference, 384-386, 2012
902012
A CMOS imager with column-level ADC using dynamic column fixed-pattern noise reduction
MF Snoeij, AJP Theuwissen, KAA Makinwa, JH Huijsing
IEEE Journal of Solid-State Circuits 41 (12), 3007-3015, 2006
872006
Integrated polarization analyzing CMOS image sensor for material classification
M Sarkar, DSSSS Bello, C Van Hoof, A Theuwissen
IEEE Sensors Journal 11 (8), 1692-1703, 2010
812010
A CMOS image sensor with a buried-channel source follower
X Wang, MF Snoeij, PR Rao, A Mierop, AJP Theuwissen
2008 IEEE International Solid-State Circuits Conference-Digest of Technical …, 2008
722008
A CMOS image sensor with a column-level multiple-ramp single-slope ADC
MF Snoeij, P Donegan, AJP Theuwissen, KAA Makinwa, JH Huijsing
2007 IEEE International Solid-State Circuits Conference. Digest of Technical …, 2007
692007
Column-parallel digital correlated multiple sampling for low-noise CMOS image sensors
Y Chen, Y Xu, AJ Mierop, AJP Theuwissen
IEEE Sensors Journal 12 (4), 793-799, 2011
592011
Degradation of CMOS image sensors in deep-submicron technology due to γ-irradiation
PR Rao, X Wang, AJP Theuwissen
Solid-State Electronics 52 (9), 1407-1413, 2008
592008
Biologically inspired CMOS image sensor for fast motion and polarization detection
M Sarkar, DSS Bello, C van Hoof, AJP Theuwissen
IEEE Sensors Journal 13 (3), 1065-1073, 2012
552012
Negative offset operation of four-transistor CMOS image pixels for increased well capacity and suppressed dark current
B Mheen, YJ Song, AJP Theuwissen
IEEE electron device letters 29 (4), 347-349, 2008
532008
A CMOS image sensor with in-pixel buried-channel source follower and optimized row selector
Y Chen, X Wang, AJ Mierop, AJP Theuwissen
IEEE transactions on electron devices 56 (11), 2390-2397, 2009
522009
Influence of terrestrial cosmic rays on the reliability of CCD image sensors—Part 1: Experiments at room temperature
AJP Theuwissen
IEEE Transactions on Electron Devices 54 (12), 3260-3266, 2007
492007
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