| A methodology for trace signal selection to improve error detection in post-silicon validation B Kumar, A Jindal, V Singh, M Fujita 2017 30th International Conference on VLSI Design and 2017 16th …, 2017 | 19 | 2017 |
| Post-silicon observability enhancement with topology based trace signal selection B Kumar, A Jindal, M Fujita, V Singh 2017 18th IEEE Latin American Test Symposium (LATS), 1-6, 2017 | 12 | 2017 |
| Combining restorability and error detection ability for effective trace signal selection B Kumar, A Jindal, M Fujita, V Singh Proceedings of the on Great Lakes Symposium on VLSI 2017, 191-196, 2017 | 11 | 2017 |
| Phase III trial of molnupiravir in adults with mild SARS-CoV-2 infection in India N Kumarasamy, B Saha, A Jindal, VB Singh, NC Reddy Podduturi, ... Topics in Antiviral Medicine, 39-39, 2022 | 8 | 2022 |
| Silicon debug with maximally expanded internal observability using nearest neighbor algorithm A Jindal, B Kumar, N Jindal, M Fujita, V Singh 2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 46-51, 2018 | 5 | 2018 |
| Improving post-silicon error detection with topological selection of trace signals B Kumar, K Basu, A Jindal, M Fujita, V Singh 2017 IFIP/IEEE International Conference on Very Large Scale Integration …, 2017 | 5 | 2017 |
| A trace signal selection algorithm for improved post-silicon debug B Kumar, A Jindal, V Singh 2016 IEEE East-West Design & Test Symposium (EWDTS), 1-4, 2016 | 4 | 2016 |
| Elura: A methodology for post-silicon gate-level error localization using regression analysis A Jindal, B Kumar, K Basu, M Fujita 2018 31st International Conference on VLSI Design and 2018 17th …, 2018 | 3 | 2018 |
| Revisiting random access scan for effective enhancement of post-silicon observability B Kumar, A Jindal, J Tudu, B Pandey, V Singh 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System …, 2017 | 1 | 2017 |
| A formal perspective on effective post-silicon debug and trace signal selection B Kumar, K Basu, A Jindal, B Pandey, M Fujita VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee …, 2017 | 1 | 2017 |
| Harsha P, Sri 732 Hashimoto, Masanori 429, 522 He, Linjun 6 He, Zhezhi 130, 533 S Hemmady, J Draper, R Drechsler, M Duan, LHK Duong, J Dworak, ... | | |
