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Brecht Truijen
Brecht Truijen
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Year
Euclidean Axion Wormholes Have Multiple Negative Modes
T Hertog, B Truijen, T Van Riet
Physical Review Letters 123 (8), 081302, 2019
342019
Euclidean axion wormholes have multiple negative modes
T Hertog, B Truijen, T Van Riet
Physical review letters 123 (8), 081302, 2019
342019
Holography, brane intersections and six-dimensional SCFTs
N Bobev, G Dibitetto, FF Gautason, B Truijen
Journal of High Energy Physics 2017 (2), 1-32, 2017
342017
Defect profiling in FEFET Si:HfO2 layers
BJ O'Sullivan, V Putcha, R Izmailov, V Afanas' ev, E Simoen, T Jung, ...
Applied Physics Letters 117 (20), 203504, 2020
262020
The many faces of brane-flux annihilation
FF Gautason, B Truijen, T Van Riet
Journal of High Energy Physics 2015 (10), 1-24, 2015
232015
Smeared antibranes polarise in AdS
FF Gautason, B Truijen, T Van Riet
Journal of High Energy Physics 2015 (7), 1-23, 2015
192015
Physical Insights on Steep Slope FEFETs including Nucleation-Propagation and Charge Trapping
Y Xiang, MG Bardon, MNK Alam, M Thesberg, B Kaczer, P Roussel, ...
2019 IEEE International Electron Devices Meeting (IEDM), 21.6. 1-21.6. 4, 2019
142019
Investigation of the impact of hot-carrier-induced interface state generation on carrier mobility in nMOSFET
Z Wu, J Franco, B Truijen, P Roussel, B Kaczer, D Linten, G Groeseneken
IEEE Transactions on Electron Devices 68 (7), 3246-3253, 2021
102021
Non-SUSY fractional branes
S Kuperstein, B Truijen, T Van Riet
Journal of High Energy Physics 2015 (3), 1-25, 2015
102015
Comments on fake supersymmetry
JD Dorronsoro, B Truijen, T Van Riet
Classical and Quantum Gravity 34 (9), 095003, 2017
72017
Britto-Cachazo-Feng-Witten Recursion
B Truijen
72012
Insight to Data Retention loss in ferroelectric Hf0.5Zr0.5O2 pFET and nFET from simultaneous PV and IV measurements
MNK Alam, Y Higashi, B Truijen, B Kaczer, MI Popovici, B O’Sullivan, ...
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and …, 2022
42022
Modelling ultra-fast threshold voltage instabilities in Hf-based ferroelectrics
BJ O’Sullivan, B Truijen, V Putcha, A Grill, A Chasin, G Van Den Bosch, ...
2022 IEEE International Reliability Physics Symposium (IRPS), 4A. 4-1-4A. 4-8, 2022
42022
Dielectric Response in Ferroelectrics Near Polarization Switching: Analytical Calculations, First-Principles Modeling, and Experimental Verification
S Clima, AS Verhulst, P Bagul, B Truijen, SRC McMitchell, I De Wolf, ...
IEEE Transactions on Electron Devices 69 (9), 5345-5350, 2022
32022
On the Modeling of Polycrystalline Ferroelectric Thin Films: Landau-Based Models Versus Monte Carlo-Based Models Versus Experiment
M Thesberg, MNK Alam, B Truijen, B Kaczer, PJ Roussel, Z Stanojević, ...
IEEE Transactions on Electron Devices 69 (6), 3105-3112, 2022
32022
Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks
B Truijen, B O'Sullivan, MNK Alam, D Claes, M Thesberg, P Roussel, ...
2022 IEEE International Reliability Physics Symposium (IRPS), P12-1-P12-4, 2022
32022
HfZrO ferroelectric characterization and parameterization of response to arbitrary excitation waveform
MNK Alam, M Thesberg, B Kaczer, P Roussel, B Vermeulen, B Truijen, ...
2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference …, 2019
32019
Bias Temperature Instability (BTI) of High-Voltage Devices for Memory Periphery
JP Bastos, BJ O’Sullivan, J Franco, S Tyaginov, B Truijen, A Chasin, ...
2022 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2022
22022
Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors
K Croes, V Simons, B Truijen, P Roussel, K Van Sever, A Tsiara, J Franco, ...
2022 Optical Fiber Communications Conference and Exhibition (OFC), 1-3, 2022
22022
Physics-based device aging modelling framework for accurate circuit reliability assessment
Z Wu, J Franco, B Truijen, P Roussel, S Tyaginov, M Vandemaele, E Bury, ...
2021 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2021
22021
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