Inline quality rating of multi‐crystalline wafers based on photoluminescence images M Demant, S Rein, J Haunschild, T Strauch, H Höffler, J Broisch, ... Progress in Photovoltaics: Research and Applications 24 (12), 1533-1546, 2016 | 36 | 2016 |
Two image processing tools to analyse alkaline texture and contact finger geometry in microscope images T Strauch, M Demant, A Lorenz, J Haunschild, S Rein 29th European Photovoltaic Solar Energy Conference and Exhibition, 2014 | 17 | 2014 |
Impact of texture roughness on the front-side metallization of stencil-printed silicon solar cells A Lorenz, T Strauch, M Demant, T Fellmeth, TB Hofmeister, M Linse, ... IEEE Journal of Photovoltaics 5 (4), 1237-1244, 2015 | 15 | 2015 |
Analysis of grain structure evolution based on optical measurements of mc Si wafers T Strauch, M Demant, P Krenckel, S Riepe, S Rein Journal of Crystal Growth 454, 147-155, 2016 | 13 | 2016 |
Progress with rotational printing for the front side metallization of silicon solar cells A Lorenz, C Gredy, M Lehner, R Greutmann, H Brocker, J Rohde, ... Proc. of the 32nd EUPVSEC, 413-9, 2016 | 10 | 2016 |
Development of multicrystalline silicon for 20% efficient n-type solar cells S Riepe, P Krenckel, F Schindler, C Schmid, T Strauch, J Benick, ... 31st European Photovoltaic Solar Energy Conference and Exhibition, 2015 | 5 | 2015 |
Analysis of grain structure evolution based on optical measurements of mc-Si wafers T Strauch, M Demant, P Krenckel, S Riepe, S Rein Solar Energy Materials and Solar Cells 182, 105-112, 2018 | 3 | 2018 |
Optimized grain size of seed plates for high performance multicrystalline silicon P Krenckel, S Riepe, F Schindler, T Strauch 32nd European PV Solar Conference and Exhibition, 2016 | 3 | 2016 |
Identification of Defect-Supressing Grain Boundaries in Multicrystalline Silicon Based on Measurements of As-Cut Wafers Using Advanced Image Processing T Strauch, M Demant, P Krenckel, S Riepe, S Rein Proceedings of the 33rd European Photovoltaic Solar Energy Conference and …, 2017 | 2 | 2017 |
Feeding of liquid silicon for high performance multicrystalline silicon with increased ingot height and homogenized resistivity P Krenckel, S Riepe, F Schindler, T Strauch Journal of Crystal Growth 463, 145-150, 2017 | 2 | 2017 |
Grain boundaries and dislocations in Si-bricks: inline characterization on as-cut wafers T Strauch, M Demant, P Krenckel, S Riepe, S Rein Energy Procedia 124, 806-813, 2017 | 1 | 2017 |
Analysis of grain structure evolution via image processing based on optical measurements of mc Si wafers T Strauch, M Demant, P Krenckel, S Riepe, S Rein 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC), 1297-1302, 2016 | 1 | 2016 |
Inline quality rating of multicrystalline wafers–Relevance, approach and performance of Al-BSF and PERC processes M Demant, T Strauch, K Sunder, O Anspach, J Haunschild, S Rein | | |