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Chien-Chung Hung
Chien-Chung Hung
Hestia Power Inc.
Verified email at hestia-power.com
Title
Cited by
Cited by
Year
Structure and access method for magnetic memory cell and circuit of magnetic memory
CC Hung, YH Chen, MJ Kao, YJ Lee, YH Wang
US Patent 7,515,458, 2009
1042009
Adjacent-reference and self-reference sensing scheme with novel orthogonal wiggle MRAM cell
CC Hung, YS Chen, DY Wang, YJ Lee, WC Chen, YH Wang, CT Yen, ...
2006 International electron devices meeting, 1-4, 2006
1002006
High efficiency high reliability SiC MOSFET with monolithically integrated Schottky rectifier
FJ Hsu, CT Yen, CC Hung, HT Hung, CY Lee, LS Lee, YF Huang, ...
2017 29th International Symposium on Power Semiconductor Devices and IC's …, 2017
772017
Reduction in critical current density for spin torque transfer switching with composite free layer
CT Yen, WC Chen, DY Wang, YJ Lee, CT Shen, SY Yang, CH Tsai, ...
Applied Physics Letters 93 (9), 2008
542008
Structure of magnetic memory cell and magnetic memory device
YJ Lee, DY Wang, CC Hung
US Patent App. 11/964,008, 2009
422009
MRAM defect analysis and fault modeling
CL Su, RF Huang, CW Wu, CC Hung, MJ Kao, YJ Chang, WC Wu
2004 International Conferce on Test, 124-133, 2004
392004
Magnetic memory cell and manufacturing method thereof
CC Hung, JG Zhu, MJ Kao
US Patent App. 11/307,658, 2007
352007
1700V/30A 4H-SiC MOSFET with low cut-in voltage embedded diode and room temperature boron implanted termination
CT Yen, CC Hung, HT Hung, LS Lee, CY Lee, TM Yang, YF Huang, ...
2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's …, 2015
332015
Negative bias temperature instability of SiC MOSFET induced by interface trap assisted hole trapping
CT Yen, CC Hung, HT Hung, CY Lee, LS Lee, YF Huang, FJ Hsu
Applied Physics Letters 108 (1), 2016
312016
Testing MRAM for write disturbance fault
C Su, C Tsai, C Wu, C Hung, Y Chen, M Kao
2006 IEEE International Test Conference, 1-9, 2006
302006
Oxide breakdown reliability of SiC MOSFET
CT Yen, HY Lee, CC Hung, CY Lee, LS Lee, FJ Hsu, KT Chu
2019 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia …, 2019
292019
Multi-sensing level MRAM structures
WC Lin, DD Tang, CC Hung
US Patent 7,166,881, 2007
292007
Stepped trench MOSFET and method of fabricating the same
CT Yen, CC Hung, YS Chen, CY Lee
US Patent 8,841,721, 2014
252014
Large photoinduced ferroelectric coercive field increase and photodefined domain pattern in lithium‐tantalate crystal
S Chao, CC Hung
Applied physics letters 69 (25), 3803-3805, 1996
251996
Magnetic random access memory with memory cells of different resistances connected in series and parallel
CC Hung, MJ Kao, TM Pan
US Patent 6,757,189, 2004
242004
Magnetic random access memory with memory cells of different resistances connected in series and parallel
CC Hung, MJ Kao, TM Pan
US Patent 6,757,189, 2004
242004
Write disturbance modeling and testing for MRAM
CL Su, CW Tsai, CW Wu, CC Hung, YS Chen, DY Wang, YJ Lee, MJ Kao
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 16 (3), 277-288, 2008
212008
Avalanche ruggedness and reverse-bias reliability of SiC MOSFET with integrated junction barrier controlled Schottky rectifier
CT Yen, FJ Hsu, CC Hung, CY Lee, LS Lee, YF Li, KT Chu
2018 IEEE 30th International Symposium on Power Semiconductor Devices and …, 2018
202018
High density magnetic random access memory
CC Hung, MJ Kao, TM Pan
US Patent App. 10/421,893, 2004
202004
Silicon carbide semiconductor device
CT Yen, CC Hung, CY Lee, LS Lee
US Patent 9,246,016, 2016
182016
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