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Co-authors
Terry N. GuoVerified email at tntech.edu- Zhen HUTennessee Technological UniversityVerified email at students.tntech.edu
- Husheng LiThe University of TennesseeVerified email at utk.edu
- 贺兴 Xing HE上海交通大学 Shanghai Jiaotong UniversityVerified email at sjtu.edu.cn
- Lei ChuShanghai Jiaotong UniversityVerified email at sjtu.edu.cn
- Chenming (Jim) ZhouNational Institute for Occupational Safety and Health (NIOSH)Verified email at cdc.gov
- I-Tai LuDepartment of Electrical and Computer Engineering, Tandon School of Engineering, New York UniversityVerified email at nyu.edu
- Lifeng LaiProfessor, University of California, DavisVerified email at ucdavis.edu
- Zenan LingPeking UniversityVerified email at pku.edu.cn
- Haichun LiuShanghai Jiao Tong UniversityVerified email at sjtu.edu.cn
- Brian M SadlerArmy Research LaboratoryVerified email at mail.mil
- Changchun ZhangOracle, IncVerified email at oracle.com
- Fei WenDepartment of Electronic Engineering, Shanghai Jiao Tong UniversityVerified email at sjtu.edu.cn
- Feng LinZhejiang UniversityVerified email at zju.edu.cn
- Xuemin (Sherman) ShenUniversity Professor, University of WaterlooVerified email at uwaterloo.ca
- Huaping LiuProfessor of Electrical Engineering, Oregon State UniversityVerified email at oregonstate.edu
- Xin ShiCenter for Big Data Engineering Technology, Shanghai Jiao Tong UniversityVerified email at sjtu.edu.cn
- Zhiqiang WuProfessor of Electrical Engineering, Wright State UniversityVerified email at wright.edu
- Haosen YangShanghai Jiaotong UniversityVerified email at sjtu.edu.cn
- Yuguang FangDistinguished Professor, Department of Electrical and Computer Engineering, University of FloridaVerified email at ece.ufl.edu
Robert C. Qiu
Professor of Electrical Engineering, Tennessee Technological University
Verified email at ieee.org - Homepage