| General equation for the determination of the crystallite size of nanographite by Raman spectroscopy MAP LG Cançado, K Takai, T Enoki, M Endo, YA Kim, H Mizusaki, A Jorio, LN ... Applied Physics Letters 88 (16), 163106, 2006 | 1788 | 2006 |
| Grazing incidence small angle x-ray scattering from free-standing nanostructures M Rauscher, R Paniago, H Metzger, Z Kovats, J Domke, J Peisl, ... Journal of Applied Physics 86 (12), 6763-6769, 1999 | 213 | 1999 |
| 3D composition of epitaxial nanocrystals by anomalous x-ray diffraction: Observation of a Si-rich core in Ge domes on Si (100) A Malachias, S Kycia, G Medeiros-Ribeiro, R Magalhaes-Paniago, ... Physical review letters 91 (17), 176101, 2003 | 205 | 2003 |
| Direct evaluation of composition profile, strain relaxation, and elastic energy of Ge: Si (001) self-assembled islands by anomalous x-ray scattering R Magalhaes-Paniago, G Medeiros-Ribeiro, A Malachias, S Kycia, ... Physical Review B 66 (24), 245312, 2002 | 128 | 2002 |
| Structural analysis of polycrystalline graphene systems by Raman spectroscopy J Ribeiro-Soares, ME Oliveros, C Garin, MV David, LGP Martins, ... Carbon 95, 646-652, 2015 | 96 | 2015 |
| Vapor–solid–solid growth mechanism driven by epitaxial match between solid AuZn alloy catalyst particles and ZnO nanowires at low temperatures LC Campos, M Tonezzer, AS Ferlauto, V Grillo, R Magalhães‐Paniago, ... Advanced Materials 20 (8), 1499-1504, 2008 | 80 | 2008 |
| Shape, size, strain and correlations in quantum dot systems studied by grazing incidence X-ray scattering methods TH Metzger, I Kegel, R Paniago, A Lorke, J Peisl, J Schulze, I Eisele, ... Thin Solid Films 336 (1-2), 1-8, 1998 | 60 | 1998 |
| Electrochemical dissolution of chalcopyrite: Detection of bornite by synchrotron small angle X-ray diffraction and its correlation with the hindered dissolution process D Majuste, VST Ciminelli, K Osseo-Asare, MSS Dantas, ... Hydrometallurgy 111, 114-123, 2012 | 59 | 2012 |
| Grazing incidence x-ray scattering: an ideal tool to study the structure of quantum dots TH Metzger, I Kegel, R Paniago, J Peisl Journal of Physics D: Applied Physics 32 (10A), A202, 1999 | 52 | 1999 |
| X-ray study of atomic ordering in self-assembled Ge islands grown on Si (001) A Malachias, TU Schülli, G Medeiros-Ribeiro, LG Cançado, M Stoffel, ... Physical Review B 72 (16), 165315, 2005 | 51 | 2005 |
| Probing the elastic properties of individual nanostructures by combining in situ atomic force microscopy and micro-x-ray diffraction T Scheler, M Rodrigues, TW Cornelius, C Mocuta, A Malachias, ... Applied Physics Letters 94 (2), 023109, 2009 | 46 | 2009 |
| Structural investigations of octadecylphosphonic acid multilayers GN Fontes, A Malachias, R Magalhaes-Paniago, BRA Neves Langmuir 19 (8), 3345-3349, 2003 | 36 | 2003 |
| Growth mode and asymptotic smoothing of sputtered Fe/Au multilayers studied by x-ray diffuse scattering R Paniago, R Forrest, PC Chow, SC Moss, SSP Parkin, D Cookson Physical Review B 56 (20), 13442, 1997 | 36 | 1997 |
| AFM characterization of PbTe quantum dots grown by molecular beam epitaxy under Volmer–Weber mode SO Ferreira, BRA Neves, R Magalhães-Paniago, A Malachias, ... Journal of crystal growth 231 (1-2), 121-128, 2001 | 35 | 2001 |
| Direct observation of the coexistence of coherent and incoherent InAs self-assembled dots by x-ray scattering A Malachias, R Magalhães-Paniago, BRA Neves, WN Rodrigues, ... Applied Physics Letters 79 (26), 4342-4344, 2001 | 30 | 2001 |
| Temperature-Induced Coexistence of a Conducting Bilayer and the Bulk-Terminated Surface of the Topological Insulator Bi2Te3 PM Coelho, GAS Ribeiro, A Malachias, VL Pimentel, WS Silva, DD Reis, ... Nano letters 13 (9), 4517-4521, 2013 | 27 | 2013 |
| X-ray method to study temperature-dependent stripe domains in R Magalhães-Paniago, LN Coelho, BRA Neves, H Westfahl, F Iikawa, ... Applied Physics Letters 86 (5), 053112, 2005 | 27 | 2005 |
| In situ observation of the elastic deformation of a single epitaxial SiGe crystal by combining atomic force microscopy and micro x-ray diffraction MS Rodrigues, TW Cornelius, T Scheler, C Mocuta, A Malachias, ... Journal of Applied Physics 106 (10), 103525, 2009 | 26 | 2009 |
| X-ray diffuse-scattering study of interfacial morphology and conformal roughness in metallic multilayers R Paniago, H Homma, PC Chow, SC Moss, Z Barnea, SSP Parkin, ... Physical Review B 52 (24), R17052, 1995 | 26 | 1995 |
| Correlation between (in) commensurate domains of multilayer epitaxial graphene grown on SiC () and single layer electronic behavior TG Mendes-de-Sa, AMB Goncalves, MJS Matos, PM Coelho, ... Nanotechnology 23 (47), 475602, 2012 | 23 | 2012 |
