|General equation for the determination of the crystallite size of nanographite by Raman spectroscopy|
MAP LG Cançado, K Takai, T Enoki, M Endo, YA Kim, H Mizusaki, A Jorio, LN ...
Applied Physics Letters 88 (16), 163106, 2006
|Grazing incidence small angle x-ray scattering from free-standing nanostructures|
M Rauscher, R Paniago, H Metzger, Z Kovats, J Domke, J Peisl, ...
Journal of Applied Physics 86 (12), 6763-6769, 1999
|3D composition of epitaxial nanocrystals by anomalous x-ray diffraction: Observation of a Si-rich core in Ge domes on Si (100)|
A Malachias, S Kycia, G Medeiros-Ribeiro, R Magalhaes-Paniago, ...
Physical review letters 91 (17), 176101, 2003
|Direct evaluation of composition profile, strain relaxation, and elastic energy of Ge: Si (001) self-assembled islands by anomalous x-ray scattering|
R Magalhaes-Paniago, G Medeiros-Ribeiro, A Malachias, S Kycia, ...
Physical Review B 66 (24), 245312, 2002
|Structural analysis of polycrystalline graphene systems by Raman spectroscopy|
J Ribeiro-Soares, ME Oliveros, C Garin, MV David, LGP Martins, ...
Carbon 95, 646-652, 2015
|Vapor–solid–solid growth mechanism driven by epitaxial match between solid AuZn alloy catalyst particles and ZnO nanowires at low temperatures|
LC Campos, M Tonezzer, AS Ferlauto, V Grillo, R Magalhães‐Paniago, ...
Advanced Materials 20 (8), 1499-1504, 2008
|Electrochemical dissolution of chalcopyrite: Detection of bornite by synchrotron small angle X-ray diffraction and its correlation with the hindered dissolution process|
D Majuste, VST Ciminelli, K Osseo-Asare, MSS Dantas, ...
Hydrometallurgy 111, 114-123, 2012
|Shape, size, strain and correlations in quantum dot systems studied by grazing incidence X-ray scattering methods|
TH Metzger, I Kegel, R Paniago, A Lorke, J Peisl, J Schulze, I Eisele, ...
Thin Solid Films 336 (1-2), 1-8, 1998
|Grazing incidence x-ray scattering: an ideal tool to study the structure of quantum dots|
TH Metzger, I Kegel, R Paniago, J Peisl
Journal of Physics D: Applied Physics 32 (10A), A202, 1999
|X-ray study of atomic ordering in self-assembled Ge islands grown on Si (001)|
A Malachias, TU Schülli, G Medeiros-Ribeiro, LG Cançado, M Stoffel, ...
Physical Review B 72 (16), 165315, 2005
|Probing the elastic properties of individual nanostructures by combining in situ atomic force microscopy and micro-x-ray diffraction|
T Scheler, M Rodrigues, TW Cornelius, C Mocuta, A Malachias, ...
Applied Physics Letters 94 (2), 023109, 2009
|Structural investigations of octadecylphosphonic acid multilayers|
GN Fontes, A Malachias, R Magalhaes-Paniago, BRA Neves
Langmuir 19 (8), 3345-3349, 2003
|Growth mode and asymptotic smoothing of sputtered Fe/Au multilayers studied by x-ray diffuse scattering|
R Paniago, R Forrest, PC Chow, SC Moss, SSP Parkin, D Cookson
Physical Review B 56 (20), 13442, 1997
|AFM characterization of PbTe quantum dots grown by molecular beam epitaxy under Volmer–Weber mode|
SO Ferreira, BRA Neves, R Magalhães-Paniago, A Malachias, ...
Journal of crystal growth 231 (1-2), 121-128, 2001
|Direct observation of the coexistence of coherent and incoherent InAs self-assembled dots by x-ray scattering|
A Malachias, R Magalhães-Paniago, BRA Neves, WN Rodrigues, ...
Applied Physics Letters 79 (26), 4342-4344, 2001
|Temperature-Induced Coexistence of a Conducting Bilayer and the Bulk-Terminated Surface of the Topological Insulator Bi2Te3|
PM Coelho, GAS Ribeiro, A Malachias, VL Pimentel, WS Silva, DD Reis, ...
Nano letters 13 (9), 4517-4521, 2013
|X-ray method to study temperature-dependent stripe domains in |
R Magalhães-Paniago, LN Coelho, BRA Neves, H Westfahl, F Iikawa, ...
Applied Physics Letters 86 (5), 053112, 2005
|In situ observation of the elastic deformation of a single epitaxial SiGe crystal by combining atomic force microscopy and micro x-ray diffraction|
MS Rodrigues, TW Cornelius, T Scheler, C Mocuta, A Malachias, ...
Journal of Applied Physics 106 (10), 103525, 2009
|X-ray diffuse-scattering study of interfacial morphology and conformal roughness in metallic multilayers|
R Paniago, H Homma, PC Chow, SC Moss, Z Barnea, SSP Parkin, ...
Physical Review B 52 (24), R17052, 1995
|Correlation between (in) commensurate domains of multilayer epitaxial graphene grown on SiC () and single layer electronic behavior|
TG Mendes-de-Sa, AMB Goncalves, MJS Matos, PM Coelho, ...
Nanotechnology 23 (47), 475602, 2012