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Franco Stellari
Franco Stellari
IBM T.J. Watson Research Center
Verified email at us.ibm.com - Homepage
Title
Cited by
Cited by
Year
New formulas of interconnect capacitances based on results of conformal mapping method
F Stellari, AL Lacaita
IEEE Transactions on Electron Devices 47 (1), 222-231, 2000
1342000
A novel scan chain diagnostics technique based on light emission from leakage current
P Song, F Stellari, T Xia, AJ Weger
2004 International Conferce on Test, 140-147, 2004
822004
CMOS circuit testing via time-resolved luminescence measurements and simulations
F Stellari, A Tosi, F Zappa, S Cova
IEEE Transactions on Instrumentation and Measurement 53 (1), 163-169, 2004
802004
Testing and diagnostics of CMOS circuits using light emission from off-state leakage current
F Stellari, P Song, JC Tsang, MK McManus, MB Ketchen
IEEE transactions on electron devices 51 (9), 1455-1462, 2004
732004
High-speed CMOS circuit testing by 50 ps time-resolved luminescence measurements
F Stellari, F Zappa, S Cova, C Porta, JC Tsang
IEEE Transactions on Electron Devices 48 (12), 2830-2835, 2001
572001
Method and apparatus for creating time-resolved emission images of integrated circuits using a single-point single-photon detector and a scanning system
F Stellari, A Tosi, F Zappa, P Song
US Patent 8,115,170, 2012
542012
Tools for non-invasive optical characterization of CMOS circuits
F Stellari, F Zappa, S Cova, L Vendrame
International Electron Devices Meeting 1999. Technical Digest (Cat. No …, 1999
541999
Verification of untrusted chips using trusted layout and emission measurements
F Stellari, P Song, AJ Weger, J Culp, A Herbert, D Pfeiffer
2014 IEEE international symposium on hardware-oriented security and trust …, 2014
532014
MARVEL—Malicious alteration recognition and verification by emission of light
P Song, F Stellari, D Pfeiffer, J Culp, A Weger, A Bonnoit, B Wisnieff, ...
2011 IEEE International Symposium on Hardware-Oriented Security and Trust …, 2011
472011
Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs
K Chatty, P Cottrell, R Gauthier, M Muhammad, F Stellari, A Weger, ...
2004 IEEE International Reliability Physics Symposium. Proceedings, 130-134, 2004
472004
Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latchup
A Weger, S Voldman, F Stellari, P Song, P Sanda, M McManus
2003 IEEE International Reliability Physics Symposium Proceedings, 2003 …, 2003
372003
Benchmarking at the frontier of hardware security: Lessons from logic locking
B Tan, R Karri, N Limaye, A Sengupta, O Sinanoglu, MM Rahman, ...
arXiv preprint arXiv:2006.06806, 2020
342020
Hot-carrier photoemission in scaled CMOS technologies: a challenge for emission based testing and diagnostics
A Tosi, F Stellari, A Pigozzi, G Marchesi, F Zappa
2006 IEEE International Reliability Physics Symposium Proceedings, 595-601, 2006
342006
Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements
F Stellari, KA Jenkins, AJ Weger, B Linder, P Song
2015 IEEE International Reliability Physics Symposium, 2B. 1.1-2B. 1.6, 2015
332015
Characterization of random process variations using ultralow-power, high-sensitivity, bias-free sub-threshold process sensor
M Meterelliyoz, P Song, F Stellari, JP Kulkarni, K Roy
IEEE Transactions on Circuits and Systems I: Regular Papers 57 (8), 1838-1847, 2010
282010
Broken scan chain diagnostics based on time-integrated and time-dependent emission measurements
F Stellari, P Song, AJ Weger, T Xia
ISTFA 2004, 52-57, 2004
282004
Circuit voltage probe based on time-integrated measurements of optical emission from leakage current
F Stellari, P Song, JC Tsang, MK McManus, MB Ketchen
ISTFA 2002, 667-672, 2002
282002
Local probing of switching noise in VLSI chips using Time Resolved Emission (TRE)
F Stellari, P Song, WD Becker
North Atlantic Test Workshop (NATW), 130-137, 2005
272005
System and method for virtual control of laboratory equipment
F Stellari, SE Steen, P Song
US Patent 8,041,437, 2011
262011
Optical diagnosis of excess IDDQ in low power CMOS circuits
F Stellari, P Song, JC Tsang, MK McManus, MB Ketchen
Microelectronics Reliability 42 (9-11), 1689-1694, 2002
262002
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