Taleana Huff
Taleana Huff
Verified email at ualberta.ca - Homepage
Title
Cited by
Cited by
Year
Atomic white-out: Enabling atomic circuitry through mechanically induced bonding of single hydrogen atoms to a silicon surface
TR Huff, H Labidi, M Rashidi, M Koleini, R Achal, MH Salomons, ...
ACS nano 11 (9), 8636-8642, 2017
302017
Binary atomic silicon logic
T Huff, H Labidi, M Rashidi, L Livadaru, T Dienel, R Achal, W Vine, ...
Nature Electronics 1 (12), 636-643, 2018
232018
Lithography for robust and editable atomic-scale silicon devices and memories
R Achal, M Rashidi, J Croshaw, D Churchill, M Taucer, T Huff, M Cloutier, ...
Nature communications 9 (1), 1-8, 2018
212018
Indications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surface
H Labidi, M Koleini, T Huff, M Salomons, M Cloutier, J Pitters, RA Wolkow
Nature communications 8, 14222, 2017
202017
Initiating and monitoring the evolution of single electrons within atom-defined structures
M Rashidi, W Vine, T Dienel, L Livadaru, J Retallick, T Huff, K Walus, ...
Physical review letters 121 (16), 166801, 2018
152018
Resolving and tuning carrier capture rates at a single silicon atom gap state
M Rashidi, E Lloyd, TR Huff, R Achal, M Taucer, JJ Croshaw, RA Wolkow
ACS nano 11 (11), 11732-11738, 2017
122017
New fabrication technique for highly sensitive qPlus sensor with well-defined spring constant
H Labidi, M Kupsta, T Huff, M Salomons, D Vick, M Taucer, J Pitters, ...
Ultramicroscopy 158, 33-37, 2015
112015
Electrostatic Landscape of a Hydrogen-Terminated Silicon Surface Probed by a Moveable Quantum Dot
TR Huff, T Dienel, M Rashidi, R Achal, L Livadaru, J Croshaw, RA Wolkow
ACS nano 13 (9), 10566-10575, 2019
62019
SiQAD: A design and simulation tool for atomic silicon quantum dot circuits
SSH Ng, J Retallick, HN Chiu, R Lupoiu, L Livadaru, T Huff, M Rashidi, ...
IEEE Transactions on Nanotechnology 19, 137-146, 2020
32020
Atomic defects of the hydrogen-terminated Silicon (100)-2x1 surface imaged with STM and nc-AFM
J Croshaw, T Dienel, T Huff, RA Wolkow
arXiv preprint arXiv:2002.09138, 2020
12020
Moveable Quantum Dot Probe for Detecting Near-Surface Fixed Charges
T Huff, T Dienel, M Rashidi, R Achal, W Vine, L Livadaru, J Croshaw, ...
arXiv preprint arXiv:1902.11296, 2019
12019
Atomic Defects of the Hydrogen-Terminated Silicon Surface Imaged with nc-AFM
J Croshaw, T Dienel, T Huff, R Wolkow
Bulletin of the American Physical Society, 2020
2020
Detecting and Directing Single Molecule Binding Events on H-Si (100) with Application to Ultradense Data Storage
R Achal, M Rashidi, J Croshaw, TR Huff, RA Wolkow
ACS nano, 2019
2019
Applications of Electronically Detecting and Precisely Directing Single-molecule Binding Events on H-Si (100)
R Achal, M Rashidi, J Croshaw, T Huff, RA Wolkow
arXiv preprint arXiv:1907.03218, 2019
2019
The Near-Surface Electrostatic Environment of n-Doped Silicon Probed with a Moveable Dangling Bond Point Probe
T Huff, T Dienel, M Rashidi, R Achal, W Vine, R Wolkow
APS Meeting Abstracts, 2019
2019
Advancing Silicon Atomic-Scale Applications
R Achal, M Rashidi, J Croshaw, D Churchill, M Taucer, T Huff, M Cloutier, ...
APS Meeting Abstracts, 2019
2019
Charge Fluctuations in Pairs of Silicon Dangling Bonds
T Dienel, W Vine, M Rashidi, L Livadaru, J Retallick, T Huff, K Walus, ...
Bulletin of the American Physical Society 63, 2018
2018
Lateral Manipulation of Single Electrons within Atom-Defined Nanostructures via nc-AFM
W Vine, M Rashidi, T Dienel, L Livadaru, J Retallick, T Huff, K Walus, ...
Bulletin of the American Physical Society 63, 2018
2018
Efficient Editing of Atomic-Scale Silicon Devices and Memories
R Achal, T Huff, M Rashidi, J Croshaw, R Wolkow
Bulletin of the American Physical Society 63, 2018
2018
Atomic Force Microscopy Characterization of Hydrogen Terminated Silicon (100) 2x1 Reconstruction
TR Huff
2015
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Articles 1–20