Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis Y Cai, EF Haratsch, O Mutlu, K Mai 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE), 521-526, 2012 | 490 | 2012 |
Threshold voltage distribution in MLC NAND flash memory: Characterization, analysis, and modeling Y Cai, EF Haratsch, O Mutlu, K Mai 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2013 | 395 | 2013 |
Error characterization, mitigation, and recovery in flash-memory-based solid-state drives Y Cai, S Ghose, EF Haratsch, Y Luo, O Mutlu Proceedings of the IEEE 105 (9), 1666-1704, 2017 | 389 | 2017 |
Data retention in MLC NAND flash memory: Characterization, optimization, and recovery Y Cai, Y Luo, EF Haratsch, K Mai, O Mutlu 2015 IEEE 21st International Symposium on High Performance Computer …, 2015 | 347 | 2015 |
Flash correct-and-refresh: Retention-aware error management for increased flash memory lifetime Y Cai, G Yalcin, O Mutlu, EF Haratsch, A Cristal, OS Unsal, K Mai 2012 IEEE 30th International Conference on Computer Design (ICCD), 94-101, 2012 | 314 | 2012 |
Program interference in MLC NAND flash memory: Characterization, modeling, and mitigation Y Cai, O Mutlu, EF Haratsch, K Mai 2013 IEEE 31st International Conference on Computer Design (ICCD), 123-130, 2013 | 267 | 2013 |
Read disturb errors in MLC NAND flash memory: Characterization, mitigation, and recovery Y Cai, Y Luo, S Ghose, O Mutlu 2015 45th Annual IEEE/IFIP International Conference on Dependable Systems …, 2015 | 244 | 2015 |
Improving 3D NAND flash memory lifetime by tolerating early retention loss and process variation Y Luo, S Ghose, Y Cai, EF Haratsch, O Mutlu Proceedings of the ACM on Measurement and Analysis of Computing Systems 2 (3 …, 2018 | 171 | 2018 |
Vulnerabilities in MLC NAND flash memory programming: Experimental analysis, exploits, and mitigation techniques Y Cai, S Ghose, Y Luo, K Mai, O Mutlu, EF Haratsch 2017 IEEE International Symposium on High Performance Computer Architecture …, 2017 | 169 | 2017 |
WARM: Improving NAND flash memory lifetime with write-hotness aware retention management Y Luo, Y Cai, S Ghose, J Choi, O Mutlu 2015 31st Symposium on Mass Storage Systems and Technologies (MSST), 1-14, 2015 | 154 | 2015 |
HeatWatch: Improving 3D NAND flash memory device reliability by exploiting self-recovery and temperature awareness Y Luo, S Ghose, Y Cai, EF Haratsch, O Mutlu 2018 IEEE International Symposium on High Performance Computer Architecture …, 2018 | 150 | 2018 |
Neighbor-cell assisted error correction for MLC NAND flash memories Y Cai, G Yalcin, O Mutlu, EF Haratsch, O Unsal, A Cristal, K Mai ACM SIGMETRICS Performance Evaluation Review 42 (1), 491-504, 2014 | 107 | 2014 |
Preventing programming errors from occurring when programming flash memory cells Y Cai, Y Wu, Z Chen, E Haratsch US Patent 9,417,960, 2016 | 106 | 2016 |
ERROR ANALYSIS AND RETENTION-AWARE ERROR MANAGEMENT FOR NAND FLASH MEMORY. Y Cai, G Yalcin, O Mutlu, EF Haratsch, A Crista, OS Unsal, K Mai Intel Technology Journal 17 (1), 2013 | 101 | 2013 |
Enabling accurate and practical online flash channel modeling for modern MLC NAND flash memory Y Luo, S Ghose, Y Cai, EF Haratsch, O Mutlu IEEE Journal on Selected Areas in Communications 34 (9), 2294-2311, 2016 | 95 | 2016 |
Improving the reliability of chip-off forensic analysis of NAND flash memory devices A Fukami, S Ghose, Y Luo, Y Cai, O Mutlu Digital Investigation 20, S1-S11, 2017 | 79 | 2017 |
Mitigation of write errors in multi-level cell flash memory through adaptive error correction code decoding AHS Alhussien, I Djurdjevic, Y Cai, EF Haratsch, Y Li, ET Cohen US Patent 9,319,073, 2016 | 64 | 2016 |
Errors in flash-memory-based solid-state drives: Analysis, mitigation, and recovery Y Cai, S Ghose, EF Haratsch, Y Luo, O Mutlu arXiv preprint arXiv:1711.11427, 2017 | 62 | 2017 |
FPGA-based solid-state drive prototyping platform Y Cai, EF Haratsch, M McCartney, K Mai 2011 IEEE 19th Annual International Symposium on Field-Programmable Custom …, 2011 | 51 | 2011 |
Reliability issues in flash-memory-based solid-state drives: Experimental analysis, mitigation, recovery Y Cai, S Ghose, EF Haratsch, Y Luo, O Mutlu Inside Solid State Drives (SSDs), 233-341, 2018 | 43 | 2018 |