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Sarath Mohanachandran Nair
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Defect injection, fault modeling and test algorithm generation methodology for STT-MRAM
SM Nair, R Bishnoi, MB Tahoori, G Tshagharyan, H Grigoryan, ...
2018 IEEE International Test Conference (ITC), 1-10, 2018
402018
A spintronics memory PUF for resilience against cloning counterfeit
SB Dodo, R Bishnoi, SM Nair, MB Tahoori
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 27 (11 …, 2019
352019
VAET-STT: Variation aware STT-MRAM analysis and design space exploration tool
SM Nair, R Bishnoi, MS Golanbari, F Oboril, F Hameed, MB Tahoori
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2017
242017
Defect characterization and test generation for spintronic-based compute-in-memory
SM Nair, C Münch, MB Tahoori
2020 IEEE European Test Symposium (ETS), 1-6, 2020
222020
Process variation and temperature aware adaptive scrubbing for retention failures in STT-MRAM
N Sayed, SM Nair, R Bishnoi, MB Tahoori
2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC), 203-208, 2018
192018
VAET-STT: A variation aware estimator tool for STT-MRAM based memories
SM Nair, R Bishnoi, MS Golanbari, F Oboril, MB Tahoori
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 …, 2017
162017
Special session–emerging memristor based memory and CIM architecture: Test, repair and yield analysis
R Bishnoi, L Wu, M Fieback, C Münch, SM Nair, M Tahoori, Y Wang, H Li, ...
2020 IEEE 38th VLSI Test Symposium (VTS), 1-10, 2020
152020
A comprehensive framework for parametric failure modeling and yield analysis of STT-MRAM
SM Nair, R Bishnoi, MB Tahoori
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 27 (7 …, 2019
132019
Physics based modeling of bimodal electromigration failure distributions and variation analysis for VLSI interconnects
SM Nair, R Bishnoi, MB Tahoori, H Zahedmanesh, K Croes, K Garello, ...
2020 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2020
92020
Variation-aware physics-based electromigration modeling and experimental calibration for VLSI interconnects
SM Nair, R Bishnoi, MB Tahoori, H Zahedmanesh, K Croes, K Garello, ...
2019 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2019
92019
Parametric failure modeling and yield analysis for STT-MRAM
SM Nair, R Bishnoi, MB Tahoori
2018 Design, Automation & Test in Europe Conference & Exhibition (DATE), 265-268, 2018
92018
Workload-aware electromigration analysis in emerging spintronic memory arrays
SM Nair, M Mayahinia, MB Tahoori, M Perumkunnil, H Zahedmanesh, ...
IEEE Transactions on Device and Materials Reliability 21 (2), 258-266, 2021
82021
Dynamic faults based hardware trojan design in stt-mram
SM Nair, R Bishnoi, A Vijayan, MB Tahoori
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 933-938, 2020
82020
Mitigating read failures in stt-mram
SM Nair, R Bishnoi, MB Tahoori
2020 IEEE 38th VLSI Test Symposium (VTS), 1-6, 2020
72020
Variation-aware fault modeling and test generation for STT-MRAM
SM Nair, R Bishnoi, MB Tahoori, H Grigoryan, G Tshagharyan
2019 IEEE 25th International Symposium on On-Line Testing and Robust System …, 2019
52019
Using multifunctional standardized stack as universal spintronic technology for IoT
M Tahoori, SM Nair, R Bishnoi, S Senni, J Mohdad, F Mailly, L Torres, ...
2018 Design, Automation & Test in Europe Conference & Exhibition (DATE), 931-936, 2018
52018
GREAT: heteroGeneous integRated magnetic tEchnology using multifunctional standardized sTack
M Tahoori, SM Nair, R Bishnoi, S Senni, J Mohdad, F Mailly, L Torres, ...
2017 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 344-349, 2017
52017
Variation analysis, fault modeling and yield improvement of emerging spintronic memories
SM Nair
KIT-Bibliothek, 2020
32020
Emerging biomarkers for early detection of cardiovascular disease
K Peera, A Rawat, SM Nair, O Jamakala, MC Jamali
Journal of Advanced Zoology 44, 1672-1638, 2023
22023
A universal spintronic technology based on multifunctional standardized stack
M Tahoori, SM Nair, R Bishnoi, L Torres, S Senni, G Patrigeon, P Benoit, ...
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 394-399, 2020
12020
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