Ijaz A. Rauf
Ijaz A. Rauf
Verified email at yorku.ca
Title
Cited by
Cited by
Year
Structure and properties of tin‐doped indium oxide thin films prepared by reactive electron‐beam evaporation with a zone‐confining arrangement
IA Rauf
Journal of applied physics 79 (8), 4057-4065, 1996
921996
Process for engineering coherent twin and coincident site lattice grain boundaries in polycrystalline materials
I Rauf
US Patent 5,651,839, 1997
891997
Low resistivity and high mobility tin-doped indium oxide films
IA Rauf
Materials Letters 18 (3), 123-127, 1993
771993
Effects of oxygen partial pressure on the properties of reactively evaporated thin films of indium oxide
S Naseem, IA Rauf, K Hussain, NA Malik
Thin Solid Films 156 (1), 161-171, 1988
691988
A novel method for preparing thin films with selective doping in a single evaporation step
IA Rauf
Journal of materials science letters 12 (24), 1902-1905, 1993
431993
Dose-rate dependence of electron-induced mass loss from organic specimens
RF Egerton, I Rauf
Ultramicroscopy 80 (4), 247-254, 1999
341999
Effects of microstructure on the optical properties of tin-doped indium oxide thin films studied by electron energy loss spectroscopy
IA Rauf, J Yuan
Materials Letters 25 (5-6), 217-222, 1995
191995
Electropolishing of polycrystalline and single-crystal YBa2Cu3O7− δ for TEM studies
R Wheeler
Ultramicroscopy 35 (1), 59-64, 1991
191991
A review of materials selection for optimized efficiency in quantum dot sensitized solar cells: a simplified approach to reviewing literature data
IA Rauf, P Rezai
Renewable and Sustainable Energy Reviews 73, 408-422, 2017
182017
In situ study of amorphous to crystalline transition in indium oxide thin films using transmission electron microscopy
IA Rauf, LM Brown
Acta metallurgica et materialia 42 (1), 57-64, 1994
161994
Extraction of free carrier density and mobility from the optical transmission data of tin-doped indium oxide thin films
IA Rauf
Materials Letters 23 (1-3), 73-78, 1995
141995
A comparative study of microstructure (in ITO films) and techniques (CTEM and STM)
IA Rauf, MG Walls
Ultramicroscopy 35 (1), 19-26, 1991
141991
andP. H. Gaskell
IA Rauf, MG Walls
Trans. R. Microsc. Soc 1, 165, 1990
81990
A comparison of scanning tunnelling microscopy with conventional and scanning transmission electron microscopy using tin-doped indium oxide thin films
IA Rauf
Surface science 325 (1-2), L413-L419, 1995
71995
Direct observation of the birth of a nanocrystalline nucleus in an amorphous matrix
IA Rauf
Applied Physics Letters 93 (14), 143101, 2008
62008
Microstructural evolution during thermomechanical processing of a Ti-Nb interstitial-free steel just below the Ar 3 temperature
IA Rauf, JD Boyd
Metallurgical and Materials Transactions A 28 (7), 1437-1443, 1997
61997
The dominant scattering mechanisms in tin-doped indium oxide thin films
IA Rauf
Journal of Physics D: Applied Physics 27 (5), 1083, 1994
61994
Microstructure of amorphous indium oxide and tin oxide thin films
IA Rauf, LM Brown
Scripta metallurgica et materialia 30 (6), 797-801, 1994
61994
A cross-correlation measure of order in “amorphous” indium oxide
JM Rodenburg, IA Rauf
Inst Phys Conf Ser 98 (5), 119-122, 1989
61989
Microscopy in solid state science
AJ McGibbon, LM Brown, AL Bleloch, ND Browning, ...
Microscopy research and technique 24 (4), 299-315, 1993
51993
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