Ijaz A. Rauf
Ijaz A. Rauf
Verified email at yorku.ca
Cited by
Cited by
Structure and properties of tin‐doped indium oxide thin films prepared by reactive electron‐beam evaporation with a zone‐confining arrangement
IA Rauf
Journal of applied physics 79 (8), 4057-4065, 1996
Process for engineering coherent twin and coincident site lattice grain boundaries in polycrystalline materials
I Rauf
US Patent 5,651,839, 1997
Low resistivity and high mobility tin-doped indium oxide films
IA Rauf
Materials Letters 18 (3), 123-127, 1993
Effects of oxygen partial pressure on the properties of reactively evaporated thin films of indium oxide
S Naseem, IA Rauf, K Hussain, NA Malik
Thin Solid Films 156 (1), 161-171, 1988
A novel method for preparing thin films with selective doping in a single evaporation step
IA Rauf
Journal of materials science letters 12 (24), 1902-1905, 1993
Dose-rate dependence of electron-induced mass loss from organic specimens
RF Egerton, I Rauf
Ultramicroscopy 80 (4), 247-254, 1999
Effects of microstructure on the optical properties of tin-doped indium oxide thin films studied by electron energy loss spectroscopy
IA Rauf, J Yuan
Materials Letters 25 (5-6), 217-222, 1995
Electropolishing of polycrystalline and single-crystal YBa2Cu3O7− δ for TEM studies
R Wheeler
Ultramicroscopy 35 (1), 59-64, 1991
A review of materials selection for optimized efficiency in quantum dot sensitized solar cells: a simplified approach to reviewing literature data
IA Rauf, P Rezai
Renewable and Sustainable Energy Reviews 73, 408-422, 2017
In situ study of amorphous to crystalline transition in indium oxide thin films using transmission electron microscopy
IA Rauf, LM Brown
Acta metallurgica et materialia 42 (1), 57-64, 1994
Extraction of free carrier density and mobility from the optical transmission data of tin-doped indium oxide thin films
IA Rauf
Materials Letters 23 (1-3), 73-78, 1995
A comparative study of microstructure (in ITO films) and techniques (CTEM and STM)
IA Rauf, MG Walls
Ultramicroscopy 35 (1), 19-26, 1991
andP. H. Gaskell
IA Rauf, MG Walls
Trans. R. Microsc. Soc 1, 165, 1990
A comparison of scanning tunnelling microscopy with conventional and scanning transmission electron microscopy using tin-doped indium oxide thin films
IA Rauf
Surface science 325 (1-2), L413-L419, 1995
Direct observation of the birth of a nanocrystalline nucleus in an amorphous matrix
IA Rauf
Applied Physics Letters 93 (14), 143101, 2008
Microstructural evolution during thermomechanical processing of a Ti-Nb interstitial-free steel just below the Ar 3 temperature
IA Rauf, JD Boyd
Metallurgical and Materials Transactions A 28 (7), 1437-1443, 1997
The dominant scattering mechanisms in tin-doped indium oxide thin films
IA Rauf
Journal of Physics D: Applied Physics 27 (5), 1083, 1994
Microstructure of amorphous indium oxide and tin oxide thin films
IA Rauf, LM Brown
Scripta metallurgica et materialia 30 (6), 797-801, 1994
A cross-correlation measure of order in “amorphous” indium oxide
JM Rodenburg, IA Rauf
Inst Phys Conf Ser 98 (5), 119-122, 1989
Microscopy in solid state science
AJ McGibbon, LM Brown, AL Bleloch, ND Browning, ...
Microscopy research and technique 24 (4), 299-315, 1993
The system can't perform the operation now. Try again later.
Articles 1–20