| Active learning of convolutional neural network for cost-effective wafer map pattern classification J Shim, S Kang, S Cho IEEE Transactions on Semiconductor Manufacturing 33 (2), 258-266, 2020 | 61 | 2020 |
| Mining the relationship between production and customer service data for failure analysis of industrial products S Kang, E Kim, J Shim, S Cho, W Chang, J Kim Computers & Industrial Engineering 106, 137-146, 2017 | 44 | 2017 |
| Product failure prediction with missing data S Kang, E Kim, J Shim, W Chang, S Cho International Journal of Production Research 56 (14), 4849-4859, 2018 | 22 | 2018 |
| Active cluster annotation for wafer map pattern classification in semiconductor manufacturing J Shim, S Kang, S Cho Expert Systems with Applications 183, 115429, 2021 | 16 | 2021 |
| Adaptive fault detection framework for recipe transition in semiconductor manufacturing J Shim, S Cho, E Kum, S Jeong Computers & Industrial Engineering 161, 107632, 2021 | 15 | 2021 |
| Domain-adaptive active learning for cost-effective virtual metrology modeling J Shim, S Kang Computers in Industry 135, 103572, 2022 | 10 | 2022 |
| Active inspection for cost-effective fault prediction in manufacturing process J Shim, S Kang, S Cho Journal of Process Control 105, 250-258, 2021 | 7 | 2021 |
| Learning from single-defect wafer maps to classify mixed-defect wafer maps J Shim, S Kang Expert Systems with Applications 233, 120923, 2023 | 2 | 2023 |
| Kernel rotation forests for classification J Shim, S Kang, S Cho 2020 IEEE International Conference on Big Data and Smart Computing (BigComp …, 2020 | 2 | 2020 |
Seokho KangSungkyunkwan UniversityVerified email at skku.edu
