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Ratan DebnathNational Institute of Standards and Technology (NIST), Gaithersburg, USAVerified email at nist.gov
Sjoerd HooglandDepartment of Electrical and Computer Engineering, University of TorontoVerified email at utoronto.ca
David ZhitomirskyMITVerified email at mit.edu
Andre J LabelleElectrical and Computer Engineering, University of TorontoVerified email at mail.utoronto.ca
Susanna ThonJohns Hopkins University, Electrical and Computer EngineeringVerified email at jhu.edu
Oleksandr VoznyyAssociate Professor at University of TorontoVerified email at utoronto.ca
Alexander H. IpCERT SystemsVerified email at utoronto.ca
Andras Pattantyus-AbrahamBestQD Solutions LLCVerified email at bestQDs.com
Xihua WangProfessor of Electrical and Computer Engineering, University of AlbertaVerified email at ualberta.ca
Graham H. CareyPhD student, University of TorontoVerified email at mail.utoronto.ca
Ghada I KoleilatAssistant Professor, Electrical and Computer Engineering, Dalhousie UniversityVerified email at dal.ca
Gerasimos KonstantatosICFOVerified email at icfo.es
Pongsakorn KanjanaboosSchool of Materials Science and Innovation, Faculty of Science, Mahidol UniversityVerified email at mahidol.ac.th
Xinzheng LanHuazhong University of Science and TechnologyVerified email at hust.edu.cn
Amirreza KianiUniversity of TorontoVerified email at mail.utoronto.ca
Mingjian YuanUniversity of TorontoVerified email at utoronto.ca
Valerio AdinolfiAppleVerified email at apple.com
Brandon R. SutherlandUniversity of TorontoVerified email at utoronto.ca
Yuan RenUniversity of Texas at AustinVerified email at physics.utexas.edu
Zheng-Hong LuUniversity of TorontoVerified email at utoronto.ca