Brian P Gorman
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In situ site-specific specimen preparation for atom probe tomography
K Thompson, D Lawrence, DJ Larson, JD Olson, TF Kelly, B Gorman
Ultramicroscopy 107 (2-3), 131-139, 2007
Atom probe tomography of electronic materials
TF Kelly, DJ Larson, K Thompson, RL Alvis, JH Bunton, JD Olson, ...
Annual Review of Materials Research 37 (1), 681-727, 2007
Mechanisms of electron-beam-induced damage in perovskite thin films revealed by cathodoluminescence spectroscopy
C Xiao, Z Li, H Guthrey, J Moseley, Y Yang, S Wozny, H Moutinho, B To, ...
The Journal of Physical Chemistry C 119 (48), 26904-26911, 2015
Minimization of Ga induced FIB damage using low energy clean-up
K Thompson, B Gorman, D Larson, B van Leer, L Hong
Microscopy and Microanalysis 12 (S02), 1736-1737, 2006
Focused ion beam milling and scanning electron microscopy characterization of polymer+ metal hybrids
W Brostow, BP Gorman, O Olea-Mejia
Materials Letters 61 (6), 1333-1336, 2007
Understanding crystallization pathways leading to manganese oxide polymorph formation
BR Chen, W Sun, DA Kitchaev, JS Mangum, V Thampy, LM Garten, ...
Nature communications 9 (1), 1-9, 2018
Hardware and techniques for cross-correlative TEM and atom probe analysis
BP Gorman, D Diercks, N Salmon, E Stach, G Amador, C Hartfield
Microscopy Today 16 (4), 42-47, 2008
High-fraction brookite films from amorphous precursors
JES Haggerty, LT Schelhas, DA Kitchaev, JS Mangum, LM Garten, W Sun, ...
Scientific reports 7 (1), 1-11, 2017
Atom probe tomography evaporation behavior of C-axis GaN nanowires: Crystallographic, stoichiometric, and detection efficiency aspects
DR Diercks, BP Gorman, R Kirchhofer, N Sanford, K Bertness, M Brubaker
Journal of Applied Physics 114 (18), 184903, 2013
Rapid repair of plasma ash damage in low-k dielectrics using supercritical
BP Gorman, RA Orozco-Teran, Z Zhang, PD Matz, DW Mueller, RF Reidy
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2004
Bandgap tuning of silicon quantum dots by surface functionalization with conjugated organic groups
T Zhou, RT Anderson, H Li, J Bell, Y Yang, BP Gorman, S Pylypenko, ...
Nano Letters 15 (6), 3657-3663, 2015
Microstructure of TRISO coated particles from the AGR-1 experiment: SiC grain size and grain boundary character
R Kirchhofer, JD Hunn, PA Demkowicz, JI Cole, BP Gorman
Journal of Nuclear Materials 432 (1-3), 127-134, 2013
Mesoporous silica films with long-range order prepared from strongly segregated block copolymer/homopolymer blend templates
VR Tirumala, RA Pai, S Agarwal, JJ Testa, G Bhatnagar, AH Romang, ...
Chemistry of Materials 19 (24), 5868-5874, 2007
Effects of hydrogen on acceptor activation in ternary nitride semiconductors
AN Fioretti, A Stokes, MR Young, B Gorman, ES Toberer, AC Tamboli, ...
Advanced Electronic Materials 3 (3), 1600544, 2017
Atom probe analysis of III–V and Si-based semiconductor photovoltaic structures
BP Gorman, AG Norman, Y Yan
Microscopy and Microanalysis 13 (6), 493-502, 2007
Exploring the limits of N-type ultra-shallow junction formation
CM Polley, WR Clarke, JA Miwa, G Scappucci, JW Wells, DL Jaeger, ...
ACS nano 7 (6), 5499-5505, 2013
High strength, low dielectric constant fluorinated silica xerogel films
BP Gorman, RA Orozco-Teran, JA Roepsch, H Dong, RF Reidy, ...
Applied physics letters 79 (24), 4010-4012, 2001
Study of thin film poly-crystalline CdTe solar cells presenting high acceptor concentrations achieved by in-situ arsenic doping
G Kartopu, O Oklobia, D Turkay, DR Diercks, BP Gorman, V Barrioz, ...
Solar Energy Materials and Solar Cells 194, 259-267, 2019
Optical properties of films prepared from colloidal suspension
V Petrovsky, BP Gorman, HU Anderson, T Petrovsky
Journal of Applied Physics 90 (5), 2517-2521, 2001
Junction Quality of SnO2-Based Perovskite Solar Cells Investigated by Nanometer-Scale Electrical Potential Profiling
C Xiao, C Wang, W Ke, BP Gorman, J Ye, CS Jiang, Y Yan, MM Al-Jassim
ACS applied materials & interfaces 9 (44), 38373-38380, 2017
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Articles 1–20