| Wavelet analysis for the detection of parametric and catastrophic faults in mixed-signal circuits AD Spyronasios, MG Dimopoulos, AA Hatzopoulos IEEE Transactions on instrumentation and measurement 60 (6), 2025-2038, 2011 | 59 | 2011 |
| Efficient static compaction of test sequence sets through the application of set covering techniques M Dimopoulos, P Linardis Proceedings Design, Automation and Test in Europe Conference and Exhibition …, 2004 | 30 | 2004 |
| Prospects of 3D inductors on through silicon vias processes for 3D ICs YI Bontzios, MG Dimopoulos, AA Hatzopoulos 2011 IEEE/IFIP 19th international conference on VLSI and system-on-chip, 90-93, 2011 | 25 | 2011 |
| Wavelet energy-based testing using supply current measurements MG Dimopoulos, AD Spyronasios, DK Papakostas, AA Hatzopoulos IET science, measurement & technology 4 (2), 76-85, 2010 | 18 | 2010 |
| An evolutionary method for efficient computation of mutual capacitance for VLSI circuits based on the method of images YI Bontzios, MG Dimopoulos, AA Hatzopoulos Simulation Modelling Practice and Theory 19 (2), 638-648, 2011 | 17 | 2011 |
| Circuit implementation of a supply current spectrum test method MG Dimopoulos, AD Spyronasios, DK Papakostas, DK Konstantinou, ... IEEE Transactions on Instrumentation and Measurement 59 (10), 2660-2670, 2010 | 16 | 2010 |
| Fault-tolerant adaptive routing under an unconstrained set of node and link failures for many-core systems-on-chip M Dimopoulos, Y Gang, L Anghel, M Benabdenbi, NE Zergainoh, ... Microprocessors and Microsystems 38 (6), 620-635, 2014 | 14 | 2014 |
| Design and development of a versatile testing system for analog and mixed-signal circuits MG Dimopoulos, DK Papakostas, AA Hatzopoulos, EI Konstantinidis, ... 2007 18th European Conference on Circuit Theory and Design, 846-849, 2007 | 14 | 2007 |
| Accelerating the compaction of test sequences in sequential circuits through problem size reduction M Dimopoulos, P Linardis IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2003 | 10 | 2003 |
| Improving a GA-based ATPG for sequential circuits by exploiting dynamically generated essential sequences M Dimopoulos, P Linardis Advances in Scientific Computing, Computational Intelligence and …, 2001 | 9 | 2001 |
| Analog and mixed-signal testing by wavelet transformations of power supply current measurements MG Dimopoulos, AD Spyronasios, DK Papakostas, DK Konstantinou, ... 2009 MIXDES-16th International Conference Mixed Design of Integrated …, 2009 | 8 | 2009 |
| Fault-tolerant adaptive routing under permanent and temporary failures for many-core systems-on-chip M Dimopoulos, Y Gang, M Benabdenbi, L Anghel, NE Zergainoh, ... 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 7-12, 2013 | 7 | 2013 |
| Microcontroller-based production-line testing M Dimopoulos, D Papakostas, A Hatzopoulos, E Konstantinidis, ... XXII Conference on Design of Circuits and Integrated Systems (DCIS), 21-23, 2007 | 5 | 2007 |
| Using non-uniform crossover in genetic algorithm methods to speed up the generation of test patterns for sequential circuits M Dimopoulos, P Linardis Hellenic Conference on Artificial Intelligence, 485-493, 2002 | 5 | 2002 |
| Advanced double-sampling architectures M Nicolaidis, M Dimopoulos 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System …, 2016 | 4 | 2016 |
| Simulation and measurements for testing an emergency luminaire circuit DK Konstantinou, MG Dimopoulos, DK Papakostas, AD Spyronasios, ... MELECON 2008-The 14th IEEE Mediterranean Electrotechnical Conference, 646-650, 2008 | 4 | 2008 |
| Testing Parametric and Catastrophic Faults in Mixed-Signal Integrated Circuits Using Wavelets AD Spyronasios, MG Dimopoulos, NP Papadopoulos, AA Hatzopoulos 2010 IEEE Computer Society Annual Symposium on VLSI, 232-237, 2010 | 3 | 2010 |
| Wavelet analysis of current measurements for mixed-signal circuit testing MG Dimopoulos, DK Papakostas, BD Vassios, AA Hatzopoulos Proceedings of 2010 IEEE International Symposium on Circuits and Systems …, 2010 | 3 | 2010 |
| Improved Selection of Test SubSequences in Sequential Circuits for Reduced Power Consumption M Dimopoulos, P Linardis Proc IMACS/IEEE-The 7th Int. MultiConference on: Circuits, Systems …, 2003 | 3 | 2003 |
| Automated substrate resistance extraction in nanoscale VLSI by exploiting a geometry-based analytical model YI Bontzios, MG Dimopoulos, AA Hatzopoulos Proceedings of the 18th International Conference Mixed Design of Integrated …, 2011 | 2 | 2011 |
Alexios SpyronasiosVerified email at ee.auth.gr
