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Marcilei Aparecida Guazzelli
Marcilei Aparecida Guazzelli
Professor of Physics, Centro Universitário da FEI, São Bernardo do Campo, São Paulo, Brazil.
Verified email at fei.edu.br
Title
Cited by
Cited by
Year
The NUMEN project: NUclear Matrix Elements for Neutrinoless double beta decay
F CAPPUZZELLO, C AGODI, M CAVALLARO, D CARBONE, S TUDISCO, ...
10.1140/epja/i2018-12509-3, 54-72, 2018
1962018
Lockstep dual-core ARM A9: Implementation and resilience analysis under heavy ion-induced soft errors
ÁB de Oliveira, GS Rodrigues, FL Kastensmidt, N Added, ELA Macchione, ...
IEEE Transactions on Nuclear Science 65 (8), 1783-1790, 2018
472018
Heavy ions induced single event upsets testing of the 28 nm Xilinx Zynq-7000 all programmable SoC
LA Tambara, FL Kastensmidt, NH Medina, N Added, VAP Aguiar, ...
2015 IEEE Radiation Effects Data Workshop (REDW), 1-6, 2015
462015
Experimental setup for single event effects at the são paulo 8ud pelletron accelerator
VAP Aguiar, N Added, NH Medina, ELA Macchione, MH Tabacniks, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2014
452014
Analysis of SRAM-based FPGA SEU sensitivity to combined EMI and TID-imprinted effects
J Benfica, B Green, BC Porcher, LB Poehls, F Vargas, NH Medina, ...
IEEE Transactions on Nuclear Science 63 (2), 1294-1300, 2016
432016
Phosphogypsum analysis: total content and extractable element concentrations
RF Gennari, NH Medina, I Garcia, MAG Silveira
432011
Dynamic distribution of potassium in sugarcane
NH Medina, MLT Branco, MAG da Silveira, RBB Santos
Journal of Environmental Radioactivity 126, 172-175, 2013
422013
Evaluating soft core RISC-V processor in SRAM-based FPGA under radiation effects
AB de Oliveira, LA Tambara, F Benevenuti, LAC Benites, N Added, ...
IEEE Transactions on Nuclear Science 67 (7), 1503-1510, 2020
392020
Reliability on ARM processors against soft errors through SIHFT techniques
E Chielle, F Rosa, GS Rodrigues, LA Tambara, J Tonfat, E Macchione, ...
IEEE Transactions on Nuclear Science 63 (4), 2208-2216, 2016
392016
Analyzing the influence of the angles of incidence and rotation on MBU events induced by low LET heavy ions in a 28-nm SRAM-based FPGA
J Tonfat, FL Kastensmidt, L Artola, G Hubert, NH Medina, N Added, ...
IEEE Transactions on Nuclear Science 64 (8), 2161-2168, 2017
332017
Boosting the total ionizing dose tolerance of digital switches by using OCTO SOI MOSFET
LN de Souza Fino, ED Neto, MAG da Silveira, C Renaux, D Flandre, ...
Semiconductor Science and Technology 30 (10), 105024, 2015
302015
Measurement of critical exponents of diamond films by atomic force microscopy imaging
MG SILVEIRA, MC SALVADORI, M CATTANI
Physical Review E - Statistical Physics, Plasmas, Fluids and Related …, 1998
23*1998
Analyzing reliability and performance trade-offs of HLS-based designs in SRAM-based FPGAs under soft errors
LA Tambara, J Tonfat, A Santos, FL Kastensmidt, NH Medina, N Added, ...
IEEE Transactions on Nuclear Science 64 (2), 874-881, 2017
222017
Radiation effect mechanisms in electronic devices
MA da Silveira, RB Santos, F Leite, F Cunha, KH Cirne, NH Medina, ...
Proceedings of the Science, Montevideo, Uruguay, 1-6, 2013
202013
Improving the X-ray radiation tolerance of the analog ICs by using OCTO layout style
LN de Souza Fino, MAG da Silveira, C Renaux, D Flandre, SP Gimenez
28th Symposium on Microelectronics Technology and Devices (SBMicro 2013), 1-4, 2013
202013
Performance of electronic devices submitted to X-rays and high energy proton beams
MAG Silveira, KH Cirne, RBB Santos, SP Gimenez, NH Medina, N Added, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2012
172012
Study of proton radiation effects among diamond and rectangular gate MOSFET layouts
LE Seixas, S Finco, MAG Silveira, NH Medina, SP Gimenez
Materials Research Express 4 (1), 015901, 2017
162017
X-ray radiation effects in overlapping circular-gate MOSFET's
JA De Lima, MAG Silveira, KH Cirne, RBB Santos, NH Medina
2011 12th European Conference on Radiation and Its Effects on Components and …, 2011
152011
Experimental setups for single event effect studies
NH MEDINA, VÂP de Aguiar, N Added, F Aguirre, ELA Macchione, ...
Journal of Nuclear Physics, Material Sciences, Radiation and Applications, 2016
142016
Roughness and critical exponents analysis of diamond films by AFM imaging
MAG SILVEIRA, MC SALVADORI, M CATTANI
Thin Solid Films 345, 1, 1999
12*1999
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