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F. C-P. Massabuau
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Morphological, structural, and emission characterization of trench defects in InGaN/GaN quantum well structures
FCP Massabuau, SL Sahonta, L Trinh-Xuan, S Rhode, TJ Puchtler, ...
Applied Physics Letters 101 (21), 2012
1022012
Effects of quantum well growth temperature on the recombination efficiency of InGaN/GaN multiple quantum wells that emit in the green and blue spectral regions
S Hammersley, MJ Kappers, FCP Massabuau, SL Sahonta, P Dawson, ...
Applied Physics Letters 107 (13), 2015
742015
The effects of Si doping on dislocation movement and tensile stress in GaN films
MA Moram, MJ Kappers, F Massabuau, RA Oliver, CJ Humphreys
Journal of Applied Physics 109 (7), 2011
722011
X-ray diffraction analysis of cubic zincblende III-nitrides
M Frentrup, LY Lee, SL Sahonta, MJ Kappers, F Massabuau, P Gupta, ...
Journal of Physics D: Applied Physics 50 (43), 433002, 2017
662017
The impact of gross well width fluctuations on the efficiency of GaN-based light emitting diodes
RA Oliver, FCP Massabuau, MJ Kappers, WA Phillips, EJ Thrush, ...
Applied Physics Letters 103 (14), 2013
662013
Indium clustering in a-plane InGaN quantum wells as evidenced by atom probe tomography
F Tang, T Zhu, F Oehler, WY Fu, JT Griffiths, FCP Massabuau, ...
Applied Physics Letters 106 (7), 2015
642015
The impact of trench defects in InGaN/GaN light emitting diodes and implications for the “green gap” problem
FCP Massabuau, MJ Davies, F Oehler, SK Pamenter, EJ Thrush, ...
Applied physics letters 105 (11), 2014
632014
A peeling approach for integrated manufacturing of large monolayer h-BN crystals
R Wang, DG Purdie, Y Fan, FCP Massabuau, P Braeuninger-Weimer, ...
ACS nano 13 (2), 2114-2126, 2019
582019
Carrier localization in the vicinity of dislocations in InGaN
F Massabuau, P Chen, MK Horton, SL Rhode, CX Ren, TJ O'Hanlon, ...
Journal of Applied Physics 121 (1), 2017
562017
Low temperature growth and optical properties of α-Ga2O3 deposited on sapphire by plasma enhanced atomic layer deposition
JW Roberts, PR Chalker, B Ding, RA Oliver, JT Gibbon, LAH Jones, ...
Journal of Crystal Growth 528, 125254, 2019
512019
Thick, adherent diamond films on AlN with low thermal barrier resistance
S Mandal, C Yuan, F Massabuau, JW Pomeroy, J Cuenca, H Bland, ...
ACS applied materials & interfaces 11 (43), 40826-40834, 2019
492019
Structure and strain relaxation effects of defects in InxGa1− xN epilayers
SL Rhode, WY Fu, MA Moram, FCP Massabuau, MJ Kappers, ...
Journal of Applied Physics 116 (10), 2014
492014
α-Ga2O3 grown by low temperature atomic layer deposition on sapphire
JW Roberts, JC Jarman, DN Johnstone, PA Midgley, PR Chalker, ...
Journal of Crystal Growth 487, 23-27, 2018
452018
Mixed-size diamond seeding for low-thermal-barrier growth of CVD diamond onto GaN and AlN
EJW Smith, AH Piracha, D Field, JW Pomeroy, GR Mackenzie, Z Abdallah, ...
Carbon 167, 620-626, 2020
442020
Atomic layer deposited α-Ga2O3 solar-blind photodetectors
J Moloney, O Tesh, M Singh, JW Roberts, JC Jarman, LC Lee, TN Huq, ...
Journal of Physics D: Applied Physics 52 (47), 475101, 2019
442019
Crystalline interlayers for reducing the effective thermal boundary resistance in GaN-on-diamond
DE Field, JA Cuenca, M Smith, SM Fairclough, FCP Massabuau, ...
ACS Applied Materials & Interfaces 12 (48), 54138-54145, 2020
412020
Correlations between the morphology and emission properties of trench defects in InGaN/GaN quantum wells
FCP Massabuau, L Trinh-Xuan, D Lodié, EJ Thrush, D Zhu, F Oehler, ...
Journal of Applied Physics 113 (7), 2013
372013
Dislocations in AlGaN: Core structure, atom segregation, and optical properties
FCP Massabuau, SL Rhode, MK Horton, TJ O’Hanlon, A Kovács, ...
Nano letters 17 (8), 4846-4852, 2017
342017
The effects of Si-doped prelayers on the optical properties of InGaN/GaN single quantum well structures
MJ Davies, P Dawson, FCP Massabuau, RA Oliver, MJ Kappers, ...
Applied Physics Letters 105 (9), 2014
292014
Integrated wafer scale growth of single crystal metal films and high quality graphene
OJ Burton, FCP Massabuau, VP Veigang-Radulescu, B Brennan, ...
ACS nano 14 (10), 13593-13601, 2020
282020
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