Chih-Hung Chen
Chih-Hung Chen
Associate Professor of Electrical & Computer Engineering, McMaster University
Verified email at mcmaster.ca - Homepage
Title
Cited by
Cited by
Year
An effective gate resistance model for CMOS RF and noise modeling
X Jin, JJ Ou, CH Chen, W Liu, MJ Deen, PR Gray, C Hu
International Electron Devices Meeting 1998. Technical Digest (Cat. No …, 1998
2141998
MOSFET modeling for RF IC design
Y Cheng, MJ Deen, CH Chen
IEEE Transactions on Electron Devices 52 (7), 1286-1303, 2005
1732005
A review of gate tunneling current in MOS devices
JC Ranuárez, MJ Deen, CH Chen
Microelectronics reliability 46 (12), 1939-1956, 2006
1692006
Channel noise modeling of deep submicron MOSFETs
CH Chen, MJ Deen
IEEE Transactions on Electron Devices 49 (8), 1484-1487, 2002
1662002
Extraction of the induced gate noise, channel noise, and their correlation in submicron MOSFETs from RF noise measurements
CH Chen, MJ Deen, Y Cheng, M Matloubian
IEEE Transactions on Electron Devices 48 (12), 2884-2892, 2001
1542001
High frequency noise of MOSFETs I Modeling
CH Chen, MJ Deen
Solid-State Electronics 42 (11), 2069-2081, 1998
1341998
A general noise and S-parameter deembedding procedure for on-wafer high-frequency noise measurements of MOSFETs
CH Chen, MJ Deen
IEEE Transactions on Microwave Theory and Techniques 49 (5), 1004-1005, 2001
1332001
High-frequency noise of modern MOSFETs: Compact modeling and measurement issues
MJ Deen, CH Chen, S Asgaran, GA Rezvani, J Tao, Y Kiyota
IEEE Transactions on Electron Devices 53 (9), 2062-2081, 2006
1122006
High-frequency small signal AC and noise modeling of MOSFETs for RF IC design
Y Cheng, CH Chen, M Matloubian, MJ Deen
IEEE Transactions on Electron Devices 49 (3), 400-408, 2002
1012002
Analytical modeling of MOSFETs channel noise and noise parameters
S Asgaran, MJ Deen, CH Chen
IEEE Transactions on Electron Devices 51 (12), 2109-2114, 2004
992004
Design of the input matching network of RF CMOS LNAs for low-power operation
S Asgaran, MJ Deen, CH Chen
IEEE Transactions on Circuits and Systems I: Regular Papers 54 (3), 544-554, 2007
852007
A 4-mW monolithic CMOS LNA at 5.7 GHz with the gate resistance used for input matching
S Asgaran, MJ Deen, CH Chen
IEEE Microwave and Wireless Components Letters 16 (4), 188-190, 2006
652006
MOSFET modeling for low noise, RF circuit design
MJ Deen, CH Chen, Y Cheng
Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No …, 2002
462002
Hot-carrier reliability of submicron NMOSFETs and integrated NMOS low noise amplifiers
S Naseh, MJ Deen, CH Chen
Microelectronics Reliability 46 (2-4), 201-212, 2006
452006
Effects of hot-carrier stress on the performance of CMOS low-noise amplifiers
S Naseh, MJ Deen, CH Chen
IEEE Transactions on Device and Materials Reliability 5 (3), 501-508, 2005
432005
High frequency noise of MOSFETs. II. Experiments
CH Chen, MJ Deen, ZX Yan, M Schroter, C Enz
Solid-State Electronics 42 (11), 2083-2092, 1998
341998
Analytical Determination of MOSFET's High-Frequency Noise Parameters From NF Measurements and Its Application in RFIC Design
S Asgaran, MJ Deen, CH Chen, GA Rezvani, Y Kamali, Y Kiyota
IEEE journal of solid-state circuits 42 (5), 1034-1043, 2007
302007
Noncontact wearable wireless ECG systems for long-term monitoring
S Majumder, L Chen, O Marinov, CH Chen, T Mondal, MJ Deen
IEEE reviews in biomedical engineering 11, 306-321, 2018
282018
Direct calculation of metal–oxide–semiconductor field effect transistor high frequency noise parameters
CH Chen, MJ Deen
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 16 (2 …, 1998
281998
Integrated water quality monitoring system with pH, free chlorine, and temperature sensors
Y Qin, AU Alam, S Pan, MMR Howlader, R Ghosh, NX Hu, H Jin, S Dong, ...
Sensors and Actuators B: Chemical 255, 781-790, 2018
272018
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