| Aging-aware logic synthesis M Ebrahimi, F Oboril, S Kiamehr, MB Tahoori 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 61-68, 2013 | 66 | 2013 |
| Analysis of transient voltage fluctuations in FPGAs DRE Gnad, F Oboril, S Kiamehr, MB Tahoori 2016 International Conference on Field-Programmable Technology (FPT), 12-19, 2016 | 53 | 2016 |
| NBTI mitigation by optimized NOP assignment and insertion F Firouzi, S Kiamehr, MB Tahoori 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE), 218-223, 2012 | 53 | 2012 |
| Aging mitigation in memory arrays using self-controlled bit-flipping technique A Gebregiorgis, M Ebrahimi, S Kiamehr, F Oboril, S Hamdioui, ... The 20th Asia and South Pacific Design Automation Conference, 231-236, 2015 | 50 | 2015 |
| Investigation of NBTI and PBTI induced aging in different LUT implementations S Kiamehr, A Amouri, MB Tahoori 2011 International Conference on Field-Programmable Technology, 1-8, 2011 | 45 | 2011 |
| Aging-aware timing analysis considering combined effects of NBTI and PBTI S Kiamehr, F Firouzi, MB Tahoori International Symposium on Quality Electronic Design (ISQED), 53-59, 2013 | 43 | 2013 |
| Aging effects in FPGAs: An experimental analysis A Amouri, F Bruguier, S Kiamehr, P Benoit, L Torres, M Tahoori 2014 24th international conference on Field Programmable Logic and …, 2014 | 41 | 2014 |
| Power-aware minimum NBTI vector selection using a linear programming approach F Firouzi, S Kiamehr, MB Tahoori IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2012 | 37 | 2012 |
| An experimental evaluation and analysis of transient voltage fluctuations in FPGAs DRE Gnad, F Oboril, S Kiamehr, MB Tahoori IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26 (10 …, 2018 | 35 | 2018 |
| Fine-grained aging-induced delay prediction based on the monitoring of run-time stress A Vijayan, A Koneru, S Kiamehr, K Chakrabarty, MB Tahoori IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2016 | 33 | 2016 |
| Statistical analysis of BTI in the presence of process-induced voltage and temperature variations F Firouzi, S Kiamehr, MB Tahoori 2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC), 594-600, 2013 | 32 | 2013 |
| VLSI Systems Long-Term Reliability–Modeling, Simulation and Optimization SXD Tan, M Tahoori, T Kim, S Wang, Z Sun, S Kiamehr Springer Publishing, 2019 | 31 | 2019 |
| Contemporary CMOS aging mitigation techniques: Survey, taxonomy, and methods N Khoshavi, RA Ashraf, RF DeMara, S Kiamehr, F Oboril, MB Tahoori Integration 59, 10-22, 2017 | 31 | 2017 |
| Temperature-aware dynamic voltage scaling to improve energy efficiency of near-threshold computing S Kiamehr, M Ebrahimi, MS Golanbari, MB Tahoori IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (7), 2017 | 31 | 2017 |
| Radiation-induced soft error analysis of SRAMs in SOI FinFET technology: A device to circuit approach S Kiamehr, T Osiecki, M Tahoori, S Nassif Proceedings of the 51st Annual Design Automation Conference, 1-6, 2014 | 30 | 2014 |
| Altering LUT configuration for wear-out mitigation of FPGA-mapped designs PMB Rao, A Amouri, S Kiamehr, MB Tahoori 2013 23rd International Conference on Field programmable Logic and …, 2013 | 29 | 2013 |
| Incorporating the impacts of workload-dependent runtime variations into timing analysis F Firouzi, S Kiamehr, M Tahoori, S Nassif 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2013 | 29 | 2013 |
| A linear programming approach for minimum NBTI vector selection F Firouzi, S Kiamehr, MB Tahoori Proceedings of the 21st edition of the great lakes symposium on Great lakes …, 2011 | 29 | 2011 |
| Reducing NBTI-induced processor wearout by exploiting the timing slack of instructions F Oboril, F Firouzi, S Kiamehr, M Tahoori Proceedings of the eighth IEEE/ACM/IFIP international conference on Hardware …, 2012 | 28 | 2012 |
| On-line prediction of NBTI-induced aging rates R Baranowski, F Firouzi, S Kiamehr, C Liu, M Tahoori, HJ Wunderlich 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE), 589-592, 2015 | 25 | 2015 |
Mehdi B. TahooriProfessor of Computer Science, Karlsruhe Institute of Technology, GermanyVerified email at kit.edu
