| Fast, high-resolution atomic force microscopy using a quartz tuning fork as actuator and sensor H Edwards, L Taylor, W Duncan, AJ Melmed Journal of applied physics 82 (3), 980-984, 1997 | 268 | 1997 |
| Energy gap and surface structure of probed by scanning tunneling microscopy HL Edwards, JT Markert, AL De Lozanne Physical review letters 69 (20), 2967, 1992 | 246 | 1992 |
| Analyzing atomic force microscopy images using spectral methods SJ Fang, S Haplepete, W Chen, CR Helms, H Edwards Journal of applied physics 82 (12), 5891-5898, 1997 | 190 | 1997 |
| A quantum‐dot refrigerator HL Edwards, Q Niu, AL De Lozanne Applied physics letters 63 (13), 1815-1817, 1993 | 171 | 1993 |
| Spatially Varying Energy Gap in the CuO Chains of Detected by Scanning Tunneling Spectroscopy HL Edwards, DJ Derro, AL Barr, JT Markert, AL de Lozanne Physical review letters 75 (7), 1387, 1995 | 158 | 1995 |
| Scanning capacitance spectroscopy: An analytical technique for pn-junction delineation in Si devices VAU Hal Edwards, Rudye McGlothlin, Richard San Martin Appl. Phys. Lett 72 (6), 698-700, 1998 | 156* | 1998 |
| Modulations in the CuO Chain Layer of : Charge Density Waves? HL Edwards, AL Barr, JT Markert, AL De Lozanne Physical review letters 73 (8), 1154, 1994 | 153 | 1994 |
| Cryogenic cooling using tunneling structures with sharp energy features HL Edwards, Q Niu, GA Georgakis, AL De Lozanne Physical Review B 52 (8), 5714, 1995 | 114 | 1995 |
| Silicon integrated circuit thermoelectric generators with a high specific power generation capacity G Hu, H Edwards, M Lee Nature Electronics 2, 300-306, 2019 | 104 | 2019 |
| -junction delineation in Si devices using scanning capacitance spectroscopy H Edwards, VA Ukraintsev, R San Martin, FS Johnson, P Menz, S Walsh, ... Journal of Applied Physics 87 (3), 1485-1495, 2000 | 77 | 2000 |
| A terraced scanning super conducting quantum interference device susceptometer with submicron pickup loops NC Koshnick, ME Huber, JA Bert, CW Hicks, J Large, H Edwards, ... Applied Physics Letters 93 (24), 2008 | 76 | 2008 |
| Scanning-probe microscope including non-optical means for detecting normal tip-sample interactions H Edwards, W Duncan US Patent 6,094,971, 2000 | 66 | 2000 |
| In situ Si flux cleaning technique for producing atomically flat Si(100) surfaces at low temperature GD Wilk, Y Wei, H Edwards, RM Wallace Applied physics letters 70 (17), 2288-2290, 1997 | 56 | 1997 |
| 14MHz organic diodes fabricated using photolithographic processes Y Ai, S Gowrisanker, H Jia, I Trachtenberg, E Vogel, RM Wallace, ... Applied physics letters 90 (26), 2007 | 44 | 2007 |
| Quantitative measurement of sheet resistance by evanescent microwave probe Z Wang, MA Kelly, ZX Shen, L Shao, WK Chu, H Edwards Applied Physics Letters 86 (15), 2005 | 44 | 2005 |
| Si0.97Ge0.03 microelectronic thermoelectric generators with high power and voltage densities R Dhawan, P Madusanka, G Hu, J Debord, T Tran, K Maggio, H Edwards, ... Nature communications 11 (1), 4362, 2020 | 42 | 2020 |
| Vertical metrology using scanning-probe microscopes: imaging distortions and measurement repeatability H Edwards, R McGlothlin, E U Journal of applied physics 83 (8), 3952-3971, 1998 | 38 | 1998 |
| Theoretical simulation of negative differential transconductance in lateral quantum well nMOS devices PB Vyas, C Naquin, H Edwards, M Lee, WG Vandenberghe, MV Fischetti Journal of Applied Physics 121 (4), 2017 | 37 | 2017 |
| Silicon carbide as a stop layer in chemical mechanical polishing for isolation dielectric HLE Leif C. Olsen, Leland S. Swanson US Patent 6,555,476, 2003 | 37* | 2003 |
| Surface structure of YBa2Cu3O7−x probed by reversed‐bias scanning tunneling microscopy HL Edwards, JT Markert, AL Lozanne Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1994 | 36 | 1994 |
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