| MVTec AD--A comprehensive real-world dataset for unsupervised anomaly detection P Bergmann, M Fauser, D Sattlegger, C Steger Proceedings of the IEEE/CVF conference on computer vision and pattern …, 2019 | 699 | 2019 |
| Improving Unsupervised Defect Segmentation by Applying Structural Similarity to Autoencoders P Bergmann, S Löwe, M Fauser, D Sattlegger, C Steger Proceedings of the 14th International Joint Conference on Computer Vision …, 2019 | 427 | 2019 |
| Uninformed students: Student-teacher anomaly detection with discriminative latent embeddings P Bergmann, M Fauser, D Sattlegger, C Steger Proceedings of the IEEE/CVF conference on computer vision and pattern …, 2020 | 335 | 2020 |
| The MVTec anomaly detection dataset: a comprehensive real-world dataset for unsupervised anomaly detection P Bergmann, K Batzner, M Fauser, D Sattlegger, C Steger International Journal of Computer Vision 129 (4), 1038-1059, 2021 | 141 | 2021 |
| Introducing mvtec itodd-a dataset for 3d object recognition in industry B Drost, M Ulrich, P Bergmann, P Hartinger, C Steger Proceedings of the IEEE international conference on computer vision …, 2017 | 102 | 2017 |
| Online photometric calibration of auto exposure video for realtime visual odometry and slam P Bergmann, R Wang, D Cremers IEEE Robotics and Automation Letters 3 (2), 627-634, 2017 | 77 | 2017 |
| The MVTec 3D-AD Dataset for Unsupervised 3D Anomaly Detection and Localization P Bergmann, X Jin, D Sattlegger, C Steger https://arxiv.org/abs/2112.09045, 2021 | 32 | 2021 |
| Beyond dents and scratches: Logical constraints in unsupervised anomaly detection and localization P Bergmann, K Batzner, M Fauser, D Sattlegger, C Steger International Journal of Computer Vision 130 (4), 947-969, 2022 | 24 | 2022 |
| Anomaly detection in 3d point clouds using deep geometric descriptors P Bergmann, D Sattlegger Proceedings of the IEEE/CVF Winter Conference on Applications of Computer …, 2023 | 8 | 2023 |
| Method for detecting anomalies in images using a plurality of machine learning programs P Bergmann, K Batzner, M Fauser, D Sattlegger US Patent App. 17/579,396, 2023 | | 2023 |
| Unsupervised Anomaly Detection and Localization for Visual Quality Inspection P Bergmann Technische Universität München, 2022 | | 2022 |
Carsten StegerDirector of Research, MVTec Software GmbH, and Professor of Computer Science, TU MünchenVerified email at in.tum.de
