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Kazutoshi Kobayashi
Kazutoshi Kobayashi
Verified email at kit.ac.jp - Homepage
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A low-power and area-efficient radiation-hard redundant flip-flop, DICE ACFF, in a 65 nm thin-BOX FD-SOI
K Kobayashi, K Kubota, M Masuda, Y Manzawa, J Furuta, S Kanda, ...
IEEE Transactions on Nuclear Science 61 (4), 1881-1888, 2014
812014
An area-efficient 65 nm radiation-hard dual-modular flip-flop to avoid multiple cell upsets
R Yamamoto, C Hamanaka, J Furuta, K Kobayashi, H Onodera
IEEE Transactions on Nuclear Science 58 (6), 3053-3059, 2011
792011
Localization of radioiodinated antibody to α-fetoprotein in hepatoma transplanted in rats and a case report of α-fetoprotein antibody treatment of a hepatoma patient
T Koji, N Ishii, T Munehisa, Y Kusumoto, S Nakamura, A Tamenishi, ...
Cancer Research 40 (8_Part_2), 3013-3015, 1980
751980
Method of and apparatus for producing video signal associated with photographic image
T Ohta, M Inuiya, K Kobayashi, T Murakami
US Patent 4,642,700, 1987
741987
Isomer Decay Spectroscopy of and : Midshell Collectivity Around
Z Patel, PA Söderström, Z Podolyák, PH Regan, PM Walker, H Watanabe, ...
Physical review letters 113 (26), 262502, 2014
622014
A 65nm Bistable Cross-coupled Dual Modular Redundancy Flip-Flop capable of protecting soft errors on the C-element
J Furuta, C Hamanaka, K Kobayashi, H Onodera
2010 Symposium on VLSI Circuits, 123-124, 2010
602010
Variation-sensitive monitor circuits for estimation of global process parameter variation
IAKM Mahfuzul, A Tsuchiya, K Kobayashi, H Onodera
IEEE Transactions on Semiconductor Manufacturing 25 (4), 571-580, 2012
582012
Finite Temperature Effects in a One-Dimensional Mott-Hubbard Insulator: Angle-Resolved Photoemission Study of
K Kobayashi, T Mizokawa, A Fujimori, M Isobe, Y Ueda, T Tohyama, ...
Physical review letters 82 (4), 803, 1999
581999
Pulmonaru vascular pathology: human and experimental studies
R Jones, LM Reid, WM Zapol, J TOMASHEFSKI JR, OC Kirton, ...
Lung biology in health and disease 24, 23-160, 1985
551985
The impact of RTN on performance fluctuation in CMOS logic circuits
K Ito, T Matsumoto, S Nishizawa, H Sunagawa, K Kobayashi, H Onodera
2011 International Reliability Physics Symposium, CR. 5.1-CR. 5.4, 2011
542011
Isolation of phytotoxic substances produced by cephalosposium gregatum allington & chamberlain
K Kotayashi, T Ui
Tetrahedron letters 16 (47), 4119-4122, 1975
461975
A New Interactive Analog Layout Methodology based on Rubber-Band Routing
K Kobayashi, WW Dai
University of California at Santa Cruz, 1996
431996
A yield and speed enhancement scheme under within-die variations on 90nm LUT array
K Katsuki, M Kotani, K Kobayashi, H Onodera
Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005 …, 2005
422005
Structural changes in the thermochromic solid-state phase transition of poly (3-alkylthiophene
K Tashiro, K Ono, Y Minagawa, K Kobayashi, T Kawai, K Yoshino
Synthetic metals 41 (1-2), 571-574, 1991
421991
Impact of cell distance and well-contact density on neutron-induced multiple cell upsets
J Furuta, K Kobayashi, H Onodera
IEICE Transactions on Electronics 98 (4), 298-303, 2015
402015
BANDO, Y. & NAKAMICHI, Y.(1974)
T Sakurai, H Iwasaki, Y Watanabe, K Kobayashi
Rikagaku Kenkyusho Hokoku 50, 75-91, 0
40
Improvement of moving-picture quality on a 42-in.-diagonal PDP for HDTV
K KOBAYASHI
'97 SID Internat. Symp. Digest Tech. Papers, 217-220, 1997
391997
Modeling of random telegraph noise under circuit operation—Simulation and measurement of RTN-induced delay fluctuation
K Ito, T Matsumoto, S Nishizawa, H Sunagawa, K Kobayashi, H Onodera
2011 12th International Symposium on Quality Electronic Design, 1-6, 2011
362011
Impact of random telegraph noise on CMOS logic circuit reliability
T Matsumoto, K Kobayashi, H Onodera
Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, 1-8, 2014
332014
Process dependence of soft errors induced by alpha particles, heavy ions, and high energy neutrons on flip flops in FDSOI
M Ebara, K Yamada, K Kojima, J Furuta, K Kobayashi
IEEE Journal of the Electron Devices Society 7, 817-824, 2019
322019
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