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Manoj Sachdev
Manoj Sachdev
Professor of Electrical and Computer Engineering, University of Waterloo
Verified email at uwaterloo.ca
Title
Cited by
Cited by
Year
CMOS SRAM circuit design and parametric test in nano-scaled technologies: process-aware SRAM design and test
A Pavlov, M Sachdev
Springer Science & Business Media, 2008
3712008
Comparative delay and energy of single edge-triggered & dual edge-triggered pulsed flip-flops for high-performance microprocessors
J Tschanz, S Narendra, Z Chen, S Borkar, M Sachdev, V De
Proceedings of the 2001 international symposium on Low power electronics and …, 2001
3502001
A soft error tolerant 10T SRAM bit-cell with differential read capability
SM Jahinuzzaman, DJ Rennie, M Sachdev
IEEE Transactions on Nuclear Science 56 (6), 3768-3773, 2009
2952009
A digitally programmable delay element: design and analysis
M Maymandi-Nejad, M Sachdev
IEEE transactions on very large scale integration (VLSI) systems 11 (5), 871-878, 2003
2422003
A monotonic digitally controlled delay element
M Maymandi-Nejad, M Sachdev
IEEE journal of solid-state circuits 40 (11), 2212-2219, 2005
2172005
Impact of self-heating effect on long-term reliability and performance degradation in CMOS circuits
O Semenov, A Vassighi, M Sachdev
IEEE transactions on device and materials reliability 6 (1), 17-27, 2006
1952006
Thermal and power management of integrated circuits
A Vassighi, M Sachdev
Springer Science & Business Media, 2006
1472006
Variation-aware adaptive voltage scaling system
M Elgebaly, M Sachdev
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 15 (5), 560-571, 2007
1442007
ESD protection device and circuit design for advanced CMOS technologies
O Semenov, H Sarbishaei, M Sachdev
Springer Science & Business Media, 2008
1312008
A method to derive an equation for the oscillation frequency of a ring oscillator
S Docking, M Sachdev
IEEE Transactions on Circuits and Systems I: Fundamental Theory and …, 2003
1292003
Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs
M Sachdev, P Janssen, V Zieren
Proceedings International Test Conference 1998 (IEEE Cat. No. 98CH36270 …, 1998
1241998
An analytical model for soft error critical charge of nanometric SRAMs
SM Jahinuzzaman, M Sharifkhani, M Sachdev
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 17 (9 …, 2009
1162009
Robust and Efficient dynamic voltage scaling for portable devices
I Kang, K Ethirajan, ML Severson, M Elgebaly, M Sachdev, A Fahim
US Patent 7,583,555, 2009
1082009
A new SEC-DED error correction code subclass for adjacent MBU tolerance in embedded memory
A Neale, M Sachdev
IEEE Transactions on Device and Materials Reliability 13 (1), 223-230, 2012
1042012
Deep sub-micron I/sub DDQ/testing: issues and solutions
M Sachdev
Proceedings European Design and Test Conference. ED & TC 97, 271-278, 1997
1011997
1-bit quantiser with rail to rail input range for sub-1 V ΔΣ modulators
M Maymandi-Nejad, M Sachdev
Electronics Letters 39 (12), 894-895, 2003
992003
Defect oriented testing for CMOS analog and digital circuits
M Sachdev
Springer Science & Business Media, 2013
952013
Industrial relevance of analog IFA: A fact or a fiction
M Sachdev, B Atzema
Proceedings of 1995 IEEE International Test Conference (ITC), 61-70, 1995
891995
Defect-oriented testing for nano-metric CMOS VLSI circuits
M Sachdev, JP De Gyvez
Springer Science & Business Media, 2007
842007
Design techniques and test methodology for low-power TCAMs
N Mohan, W Fung, D Wright, M Sachdev
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 14 (6), 573-586, 2006
832006
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