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Sergio L. Morelhao
Sergio L. Morelhao
Institute of Physics, University of Sao Paulo, Brazil
Verified email at if.usp.br
Title
Cited by
Cited by
Year
Structural properties of Bi2Te3 topological insulator thin films grown by molecular beam epitaxy on (111) BaF2 substrates
CI Fornari, PHO Rappl, SL Morelhão, E Abramof
Journal of Applied Physics 119 (16), 2016
602016
Computer simulation tools for x-ray analysis: scattering and diffraction methods
SL Morelhão
492016
X-ray multiple diffraction phenomenon in the evaluation of semiconductor crystalline perfection
SL Morelhão, LP Cardoso
Journal of applied crystallography 29 (4), 446-456, 1996
431996
Usage of Scherrer's formula in X-ray diffraction analysis of size distribution in systems of monocrystalline nanoparticles
A Valério, SL Morelhao
arXiv preprint arXiv:1911.00701, 2019
412019
Structural properties of heteroepitaxial systems using hybrid multiple diffraction in Renninger scans
SL Morelhão, LP Cardoso
Journal of applied physics 73 (9), 4218-4226, 1993
401993
Preservation of pristine Bi2Te3 thin film topological insulator surface after ex situ mechanical removal of Te capping layer
CI Fornari, PHO Rappl, SL Morelhão, TRF Peixoto, H Bentmann, ...
APL Materials 4 (10), 2016
362016
Sensitivity of Bragg surface diffraction to analyze ion-implanted semiconductors
MA Hayashi, SL Morelhão, LH Avanci, LP Cardoso, JM Sasaki, LC Kretly, ...
Applied Physics Letters 71 (18), 2614-2616, 1997
331997
Molecular beam epitaxy of antiferromagnetic (MnBi2Te4)(Bi2Te3) thin films on BaF2 (111)
P Kagerer, CI Fornari, S Buchberger, SL Morelhão, RC Vidal, A Tcakaev, ...
Journal of Applied Physics 128 (13), 2020
312020
X‐ray imaging in advanced studies of ophthalmic diseases
A Antunes, AMV Safatle, PSM Barros, SL Morelhão
Medical physics 33 (7Part1), 2338-2343, 2006
312006
Nanostructure of sol–gel films by x-ray specular reflectivity
SL Morelhão, GES Brito, E Abramof
Applied physics letters 80 (3), 407-409, 2002
292002
A versatile X-ray diffraction station at LNLS (Brazil)
C Cusatis, M Kobayashi Franco, E Kakuno, C Giles, S Morelhão, V Mello, ...
Journal of Synchrotron Radiation 5 (3), 491-493, 1998
291998
Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis
SL Morelhao, CI Fornari, PHO Rappl, E Abramof
Journal of Applied Crystallography 50 (2), 399-410, 2017
272017
Hybrid multiple diffraction in Renninger scan for heteroepitaxial layers
SL Morelhão, LP Cardoso, JM Sasaki, MMG De Carvalho
Journal of applied physics 70 (5), 2589-2593, 1991
271991
Synchrotron X‐ray Renninger scanning for studying strain in InAs/GaAs quantum dot system
RO Freitas, TE Lamas, AA Quivy, SL Morelhão
physica status solidi (a) 204 (8), 2548-2554, 2007
262007
X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals
SL Morelhao, CMR Remédios, RO Freitas, AO dos Santos
Journal of Applied Crystallography 44 (1), 93-101, 2011
242011
Enhanced X-ray phase determination by three-beam diffraction
SL Morelhão, S Kycia
Physical review letters 89 (1), 015501, 2002
242002
Strength tuning of multiple waves in crystals
SL Morelhão, LH Avanci
Acta Crystallographica Section A: Foundations of Crystallography 57 (2), 192-196, 2001
242001
An X-ray diffractometer for accurate structural invariant phase determination
SL Morelhao
Journal of Synchrotron Radiation 10 (3), 236-241, 2003
232003
Observation of coherent hybrid reflection with synchrotron radiation
SL Morelhao, LH Avanci, MA Hayashi, LP Cardoso, SP Collins
Applied physics letters 73 (15), 2194-2196, 1998
231998
Strain effects on the magnetic order of epitaxial FeRh thin films
H Kumar, DR Cornejo, SL Morelhao, S Kycia, IM Montellano, NR Alvarez, ...
Journal of Applied Physics 124 (8), 2018
222018
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Articles 1–20