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Co-authors
Shunbo LEIUniversity of MichiganVerified email at umich.edu
Zhijun Qin(覃智君)Guangxi UniversityVerified email at gxu.edu.cn
Chong WangHohai UniversityVerified email at hhu.edu.cn
Kai SunUniversity of TennesseeVerified email at utk.edu
Wei SunAssistant Professor of Electrical Engineering, University of Central FloridaVerified email at ucf.edu
Victor OK LiThe University of Hong KongVerified email at eee.hku.hk
Shengwei MeiTsinghua universityVerified email at tsinghua.edu.cn
Feng Liu (刘锋)Electrical Engineering Dept. Tsinghua UniversityVerified email at tsinghua.edu.cn
Jiabing HUState Key Lab of Advanced Electromagnetic Engineering Technology, HUSTVerified email at mail.hust.edu.cn
James Jian Qiao YuSouthern University of Science and TechnologyVerified email at sustech.edu.cn
David John HILLChair Professor, University of Hong KongVerified email at eee.hku.hk
Chen ChenXi'an Jiaotong UniversityVerified email at xjtu.edu.cn
Chen-Ching LiuVirginia TechVerified email at vt.edu
Philip W. T. PongThe University of Hong Kong [PhD (Cambridge), FIET, FEI, FIMMM, FNS, CPhys, CEng]Verified email at eee.hku.hk
Liang LiangThe University of Hong KongVerified email at eee.hku.hk
Ho-Chun WuDepartment of Electrical and Electronic Engineering, the University of Hong KongVerified email at eee.hku.hk
Albert Y.S. LamThe University of Hong KongVerified email at eee.hku.hk
S. Y. Ron HuiUniversity of Hong Kong & Imperial College LondonVerified email at eee.hku.hk
Junjian QiAssistant Professor of Electrical Engineering, Stevens Institute of TechnologyVerified email at stevens.edu
Jinyu WenHuazhong University of Science and TechnologyVerified email at hust.edu.cn