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Co-authors
- Shaikh Anowarul FattahProfessor, Dept. of EEE, BUETVerified email at eee.buet.ac.bd
- Upal MahbubQualcomm Technologies Inc.Verified email at qti.qualcomm.com
- Anand SarwateAssociate Professor, Rutgers UniversityVerified email at rutgers.edu
- Tahsina Farah Sanam, Ph.D.Rutgers University, Bangladesh University of Engineering and TechnologyVerified email at iat.buet.ac.bd
- Mahmudur KhanAssistant Professor, York College of PennsylvaniaVerified email at ycp.edu
- Mirza Saquib SarwarPhD Student at Electrical and Computer Engineering, University of British ColumbiaVerified email at ece.ubc.ca
- Raisul IslamAssistant Professor, School of Materials Engineering, Purdue UniversityVerified email at purdue.edu
- Hasan FarabyPhD Student of Electrical Engineering, University of California, San DiegoVerified email at ucsd.edu
- Ahmed Tashrif KamalUniversity of California, RiversideVerified email at ee.ucr.edu
- M. Shahriar JahanSenior Design Engineer at Qorvo, Inc.Verified email at qorvo.com
- Mohammad Ryyan KhanVerified email at ewubd.edu