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Co-authors
Liudong XingProfessor, UMass DartmouthVerified email at umassd.edu
Vinod VokkaraneProfessor, Electrical and Computer Engineering, University of Massachusetts LowellVerified email at uml.edu
Yan Lindsay SunUniversity of Rhode IslandVerified email at uri.edu
Mahmood FathyProfessor computer Engineering, Iran university of science and technologyVerified email at iust.ac.ir
Mohsen SoryaniAssociate Professor at Iran university of science and technologyVerified email at iust.ac.ir
Arghavan AsadRyerson University, Toronto, Ontario, CanadaVerified email at ryerson.ca
Reza BerangiMelbourne Institute of TechnologyVerified email at mit.edu.au
Sonia Aissa (Sonia Aïssa)Professor of Telecommunications, INRS, Université du QuébecVerified email at ieee.org
Navid TadayonHuawei TechnologiesVerified email at huawei.com
Chaonan WangJinan UniversityVerified email at umassd.edu
Gregory LevitinSenior Expert, Israel Electric Corporation; Professor of reliability engineering, UESTCVerified email at iec.co.il