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Mihir Tungare
Mihir Tungare
Infineon Technologies Americas Corp., College of Nanoscale Science and Engineering, Emcore, NJIT
Verified email at alumni.albany.edu
Title
Cited by
Cited by
Year
A Tersoff‐based interatomic potential for wurtzite AlN
M Tungare, Y Shi, N Tripathi, P Suvarna, F Shahedipour‐Sandvik
physica status solidi (a) 208 (7), 1569-1572, 2011
532011
Design and growth of visible-blind and solar-blind III-N APDs on sapphire substrates
P Suvarna, M Tungare, JM Leathersich, P Agnihotri, ...
Journal of electronic materials 42, 854-858, 2013
262013
The effect of carbon impurities on lightly doped MOCVD GaN Schottky diodes
RP Tompkins, TA Walsh, MA Derenge, KW Kirchner, S Zhou, CB Nguyen, ...
Journal of Materials Research 26 (23), 2895-2900, 2011
202011
HVPE GaN for high power electronic Schottky diodes
RP Tompkins, TA Walsh, MA Derenge, KW Kirchner, S Zhou, CB Nguyen, ...
Solid-state electronics 79, 238-243, 2013
172013
Novel Cs-free GaN photocathodes
N Tripathi, LD Bell, S Nikzad, M Tungare, PH Suvarna, FS Sandvik
Journal of electronic materials 40, 382-387, 2011
162011
Selective area heteroepitaxy of low dimensional a ‐plane and c ‐plane InGaN nanostructures using pulsed MOCVD
V Jindal, N Tripathi, M Tungare, O Paschos, P Haldar, ...
physica status solidi c 5 (6), 1709-1711, 2008
142008
Homoepitaxial growth of non-polar AlN crystals using molecular dynamics simulations
J Leathersich, P Suvarna, M Tungare, FS Shahedipour-Sandvik
Surface science 617, 36-41, 2013
122013
Charge trapping prevention III-Nitride transistor
H Kim, M Imam, A Charles, J Wan, M Tungare, CK Choi
US Patent 10,211,329, 2019
102019
Enhanced performance of an AlGaN/GaN high electron mobility transistor on Si by means of improved adatom diffusion length during MOCVD epitaxy
F Shahedipour-Sandvik, J Leathersich, RP Tompkins, P Suvarna, ...
Semiconductor science and technology 28 (7), 074002, 2013
92013
Dielectric properties and thickness metrology of strain engineered GaN/AlN/Si (111) thin films grown by MOCVD
M Tungare, VK Kamineni, F Shahedipour-Sandvik, AC Diebold
Thin Solid Films 519 (9), 2929-2932, 2011
92011
Thermal/Chemical Stability of ALD Ru-TaN Thin Films for Gate Electrode Applications
M Tungare, S Kumar, M Li, E Eisenbraun
Ecs transactions 3 (2), 303, 2006
82006
III-nitride semiconductor device with doped epi structures
J Wan, M Tungare, P Kim, SE Park, S Nelson, S Kannan
US Patent 9,608,075, 2017
72017
In Situ Stress Measurements During GaN Growth on Ion-Implanted AlN/Si Substrates
JC Gagnon, M Tungare, X Weng, JM Leathersich, F Shahedipour-Sandvik, ...
Journal of electronic materials 41, 865-872, 2012
62012
Crack-free III-nitride structures (> 3.5 μm) on silicon
M Tungare, JM Leathersich, N Tripathi, P Suvarna, ...
MRS Online Proceedings Library (OPL) 1324, mrss11-1324-d01-04, 2011
62011
Modification of dislocation behavior in GaN overgrown on engineered AlN film-on-bulk Si substrate
M Tungare, X Weng, JM Leathersich, P Suvarna, JM Redwing
Journal of Applied Physics 113 (16), 2013
52013
Density functional calculations of the binding energies and adatom diffusion on strained AlN (0001) and GaN (0001) surfaces
V Jindal, J Grandusky, N Tripathi, M Tungare, F Shahedipour-Sandvik
MRS Online Proceedings Library (OPL) 1040, 1040-Q06-02, 2007
52007
Defect-related photoluminescence in Mg-doped GaN nanostructures
MA Reshchikov, F Shahedipour-Sandvik, BJ Messer, V Jindal, N Tripathi, ...
Physica B: Condensed Matter 404 (23-24), 4903-4906, 2009
42009
Ion-Implantation-Induced Damage Characteristics Within AlN and Si for GaN-on-Si Epitaxy
JM Leathersich, M Tungare, X Weng, P Suvarna, P Agnihotri, M Evans, ...
Journal of electronic materials 42, 833-837, 2013
22013
III-Nitride devices on Si: Challenges and opportunities
F Shahedipour-Sandvik, M Tungare, J Leathersich, P Suvarna, ...
2011 International Semiconductor Device Research Symposium (ISDRS), 1-2, 2011
22011
Method of controlling wafer bow in a type III-V semiconductor device
SE Park, J Wan, M Tungare, P Kim, S Kannan
US Patent 11,387,355, 2022
12022
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