Boyang Du
Boyang Du
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FlexGripPlus: An improved GPGPU model to support reliability analysis
JER Condia, B Du, MS Reorda, L Sterpone
Microelectronics Reliability 109, 113660, 2020
Ultrahigh energy heavy ion test beam on Xilinx Kintex-7 SRAM-based FPGA
B Du, L Sterpone, S Azimi, DM Codinachs, V Ferlet-Cavrois, CB Polo, ...
IEEE Transactions on Nuclear Science 66 (7), 1813-1819, 2019
On the reliability of convolutional neural network implementation on SRAM-based FPGA
B Du, S Azimi, C De Sio, L Bozzoli, L Sterpone
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2019
Online test of control flow errors: A new debug interface-based approach
B Du, MS Reorda, L Sterpone, L Parra, M Portela-García, A Lindoso, ...
IEEE Transactions on Computers 65 (6), 1846-1855, 2015
On the functional test of the register forwarding and pipeline interlocking unit in pipelined processors
P Bernardi, R Cantoro, L Ciganda, B Du, E Sánchez, MS Reorda, ...
2013 14th International Workshop on Microprocessor Test and Verification, 52-57, 2013
Analyzing radiation-induced transient errors on SRAM-based FPGAs by propagation of broadening effect
C De Sio, S Azimi, L Sterpone, B Du
IEEE Access 7, 140182-140189, 2019
A 3-D simulation-based approach to analyze heavy ions-induced SET on digital circuits
L Sterpone, F Luoni, S Azimi, B Du
IEEE Transactions on Nuclear Science 67 (9), 2034-2041, 2020
About the functional test of the GPGPU scheduler
B Du, JER Condia, MS Reorda, L Sterpone
2018 IEEE 24th International Symposium on On-Line Testing And Robust System …, 2018
A new hybrid nonintrusive error-detection technique using dual control-flow monitoring
L Parra, A Lindoso, M Portela-Garcia, L Entrena, B Du, MS Reorda, ...
IEEE Transactions on Nuclear Science 61 (6), 3236-3243, 2014
An extended model to support detailed GPGPU reliability analysis
B Du, JER Condia, MS Reorda
2019 14th International Conference on Design & Technology of Integrated …, 2019
A new CAD tool for Single Event Transient Analysis and mitigation on Flash-based FPGAs
S Azimi, B Du, L Sterpone, DM Codinachs, R Grimoldi, L Cattaneo
Integration 67, 73-81, 2019
On the prediction of radiation-induced SETs in flash-based FPGAs
S Azimi, B Du, L Sterpone
Microelectronics Reliability 64, 230-234, 2016
Radiation-induced Single Event Transient effects during the reconfiguration process of SRAM-based FPGAs
C De Sio, S Azimi, L Bozzoli, B Du, L Sterpone
Microelectronics Reliability 100, 113342, 2019
On the evaluation of SEU effects in GPGPUs
B Du, JER Condia, MS Reorda, L Sterpone
2019 IEEE Latin American Test Symposium (LATS), 1-6, 2019
On the analysis of radiation-induced Single Event Transients on SRAM-based FPGAs
S Azimi, L Sterpone, B Du, L Boragno
Microelectronics Reliability 88, 936-940, 2018
A selective mapper for the mitigation of SETs on rad-hard RTG4 flash-based FPGAs
L Sterpone, S Azimi, B Du
2016 16th European Conference on Radiation and Its Effects on Components and …, 2016
A Novel Error Rate Estimation Approach forUltraScale+ SRAM-based FPGAs
L Sterpone, S Azimi, L Bozzoli, B Du, T Lange, M Glorieux, ...
2018 NASA/ESA Conference on Adaptive Hardware and Systems (AHS), 120-126, 2018
Evaluation of transient errors in GPGPUs for safety critical applications: An effective simulation-based fault injection environment
S Azimi, B Du, L Sterpone
Journal of Systems Architecture 75, 95-106, 2017
Analysis and mitigation of single event effects on flash-based FPGAs
L Sterpone, B Du
2014 19th IEEE European Test Symposium (ETS), 1-6, 2014
Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis
W Yang, B Du, C He, L Sterpone
Microelectronics Reliability 120, 114122, 2021
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