| High-resolution x-ray diffraction investigation of relaxation and dislocations in SiGe layers grown on (001),(011), and (111) Si substrates A Zhylik, A Benediktovich, A Ulyanenkov, H Guerault, M Myronov, ... Journal of applied physics 109 (12), 2011 | 27 | 2011 |
| Characterization of dislocations in germanium layers grown on (011)-and (111)-oriented silicon by coplanar and noncoplanar X-ray diffraction A Benediktovitch, A Zhylik, T Ulyanenkova, M Myronov, A Ulyanenkov Journal of applied crystallography 48 (3), 655-665, 2015 | 13 | 2015 |
| Covariant description of X-ray diffraction from anisotropically relaxed epitaxial structures A Zhylik, A Benediktovitch, I Feranchuk, K Inaba, A Mikhalychev, ... Journal of Applied Crystallography 46 (4), 919-925, 2013 | 11 | 2013 |
| High‐resolution reciprocal space mapping of distributed Bragg reflectors and virtual substrates A Zhylik, F Rinaldi, M Myronov, K Saito, S Menzel, A Dobbie, DR Leadley, ... physica status solidi (a) 208 (11), 2582-2586, 2011 | 1 | 2011 |
David LeadleyUniversity of WarwickVerified email at warwick.ac.uk
