| Quantitative analysis of the inelastic background in surface electron spectroscopy S Tougaard Surface and Interface Analysis 11 (9), 453-472, 1988 | 606 | 1988 |
| Systematic and collaborative approach to problem solving using X-ray photoelectron spectroscopy N Fairley, V Fernandez, M Richard‐Plouet, C Guillot-Deudon, J Walton, ... Applied Surface Science Advances 5, 100112, 2021 | 599 | 2021 |
| Electronic and optical properties of Cu, CuO and Cu2O studied by electron spectroscopy D Tahir, S Tougaard Journal of physics: Condensed matter 24 (17), 175002, 2012 | 568 | 2012 |
| Influence of elastic and inelastic scattering on energy spectra of electrons emitted from solids S Tougaard, P Sigmund Physical Review B 25 (7), 4452, 1982 | 529 | 1982 |
| Universality classes of inelastic electron scattering cross‐sections S Tougaard Surface and Interface Analysis: An International Journal devoted to the …, 1997 | 427 | 1997 |
| Differential inelastic electron scattering cross sections from experimental reflection electron-energy-loss spectra: Application to background removal in electron spectroscopy S Tougaard, I Chorkendorff Physical Review B 35 (13), 6570, 1987 | 380 | 1987 |
| Model for quantitative analysis of reflection-electron-energy-loss spectra F Yubero, S Tougaard Physical Review B 46 (4), 2486, 1992 | 309 | 1992 |
| Surface nanostructure determination by x‐ray photoemission spectroscopy peak shape analysis S Tougaard Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 14 (3 …, 1996 | 265 | 1996 |
| Inelastic-electron-scattering cross sections for Si, Cu, Ag, Au, Ti, Fe, and Pd S Tougaard, J Kraaer Physical Review B 43 (2), 1651, 1991 | 260 | 1991 |
| Model for quantitative analysis of reflection-electron-energy-loss spectra: Angular dependence F Yubero, JM Sanz, B Ramskov, S Tougaard Physical Review B 53 (15), 9719, 1996 | 203 | 1996 |
| Inelastic background correction and quantitative surface analysis S Tougaard Journal of Electron Spectroscopy and Related Phenomena 52, 243-271, 1990 | 196 | 1990 |
| Determination of the Cu 2p primary excitation spectra for Cu, Cu2O and CuO N Pauly, S Tougaard, F Yubero Surface Science 620, 17-22, 2014 | 188 | 2014 |
| Low energy inelastic electron scattering properties of noble and transition metals S Tougaard Solid state communications 61 (9), 547-549, 1987 | 186 | 1987 |
| Energy loss in XPS: Fundamental processes and applications for quantification, non-destructive depth profiling and 3D imaging S Tougaard Journal of Electron Spectroscopy and Related Phenomena 178, 128-153, 2010 | 173 | 2010 |
| Background removal in x-ray photoelectron spectroscopy: Relative importance of intrinsic and extrinsic processes S Tougaard Physical Review B 34 (10), 6779, 1986 | 151 | 1986 |
| Comparison of validity and consistency of methods for quantitative XPS peak analysis S Tougaard, C Jansson Surface and Interface Analysis 20 (13), 1013-1046, 1993 | 149 | 1993 |
| Non‐destructive depth profiling through quantitative analysis of surface electron spectra S Tougaard, HS Hansen Surface and interface analysis 14 (11), 730-738, 1989 | 127 | 1989 |
| Quantitative model of electron energy loss in XPS AC Simonsen, F Yubero, S Tougaard Physical Review B 56 (3), 1612, 1997 | 120 | 1997 |
| Formalism for quantitative surface analysis by electron spectroscopy S Tougaard Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 8 (3 …, 1990 | 106 | 1990 |
| Elastic electron backscattering from surfaces A Jablonski, J Gryko, J Kraaer, S Tougaard Physical Review B 39 (1), 61, 1989 | 106 | 1989 |
