Ardavan Zandiatashbar
Ardavan Zandiatashbar
Sr. Staff Engineer at Tesla
Verified email at rpi.edu - Homepage
Title
Cited by
Cited by
Year
Effect of defects on the intrinsic strength and stiffness of graphene
A Zandiatashbar, GH Lee, SJ An, S Lee, N Mathew, M Terrones, ...
Nature communications 5 (1), 1-9, 2014
4312014
Graphene nanoribbon composites
MA Rafiee, W Lu, AV Thomas, A Zandiatashbar, J Rafiee, JM Tour, ...
ACS nano 4 (12), 7415-7420, 2010
2682010
Control of epoxy creep using graphene
A Zandiatashbar, CR Picu, N Koratkar
Small 8 (11), 1676-1682, 2012
712012
Raman spectroscopic imaging of graphene dispersion in polymer composites
SA Shojaee, A Zandiatashbar, N Koratkar, DA Lucca
Carbon 62, 510-513, 2013
422013
Mechanical Behavior of Epoxy-Graphene Platelets Nanocomposites
A Zandiatashbar, RC Picu, N Koratkar
Journal of Engineering Materials and Technology 134, 031011-1, 2012
312012
Synergy derived by combining graphene and carbon nanotubes as nanofillers in composites
F Yavari, L Chen, A Zandiatashbar, Z Yu, N Koratkar
Journal of nanoscience and nanotechnology 12 (4), 3165-3169, 2012
132012
Sub-angstrom roughness repeatability with tip-to-tip correlation
A Zandiatashbar
Nano-scientific.org, 2014
72014
High-throughput automatic defect review for 300mm blank wafers with atomic force microscope
A Zandiatashbar, B Kim, Y Yoo, K Lee, A Jo, JS Lee, SJ Cho, S Park
Metrology, Inspection, and Process Control for Microlithography XXIX 9424†…, 2015
52015
Nanocomposite creep: control of epoxy creep using graphene (Small 11/2012)
A Zandiatashbar, CR Picu, N Koratkar
Small 8 (11), 1675-1675, 2012
42012
Depth sensing indentation of nanoscale graphene platelets in nanocomposite thin films
A Zandiatashbar, RP Catalin, N Koratkar
MRS Online Proceedings Library 1312 (1), 1-6, 2011
42011
Stiffness and strength of oxygen-functionalized graphene with vacancies
A Zandiatashbar, E Ban, RC Picu
Journal of Applied Physics 116 (18), 184308, 2014
32014
Automated Non-Destructive Imaging and Characterization of the Graphene/hBN Moirť Pattern with Non-Contact Mode AFM
A Zandiatashbar, B Kim, Y Yoo, K Lee
Microscopy Today 23 (6), 26-31, 2015
22015
Effect of defects on the intrinsic strength and stiffness of graphene
A Zandiatashbar, GH Lee, H Parvaneh, SJ An, S Lee, N Mathew, CR Picu, ...
APS March Meeting Abstracts 2013, G6. 009, 2013
22013
Fabrication of Graphene Platelet (GPL)-Epoxy Nanocomposites and Characterization by Nanoindentation
OU Colak, A Zandiatashbar
Advanced Materials Research 445, 809-814, 2012
22012
A hybrid total measurement uncertainty methodology for dual beam FIB/SEM metrology
A Zandiatashbar, C Chien
Metrology, Inspection, and Process Control for Microlithography XXXIV 11325†…, 2020
12020
Studying post-etching silicon crystal defects on 300mm wafers by automatic defect review AFM
SILP ARDAVAN ZANDIATASHBAR, PATRICK A. TAYLOR, BYONG KIM, YOUNG-KOOK YOO ...
SOLID STATE TECHNOLOGY 59, 22-26, 2016
1*2016
Automatic defect review for EUV photomask reticles by atomic force microscope
A Zandiatashbar, B Kim, Y Yoo, K Lee, A Jo, JS Lee, SJ Cho, S Park
Photomask Technology 2015 9635, 96351A, 2015
12015
Introducing machine learning-based application for writer main pole CD metrology by dual beam FIB/SEM
A Zandiatashbar, A Ngo, C Chien, J Baderot, S Martinez, B Darbon, ...
Metrology, Inspection, and Process Control for Semiconductor Manufacturing†…, 2021
2021
Scanning probe nanomechanical characterization of PS-LDPE copolymer using cantilever probes with varying stiffness
W Shi, G Pascual, A Zandiatashbar, B Kim, K Lee
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY 255, 2018
2018
Automated AFM for small-scale and large-scale surface profiling in CMP applications
A Zandiatashbar, B Kim, Y Yoo, K Lee, A Jo, JS Lee, SJ Cho, S Park
Metrology, Inspection, and Process Control for Microlithography XXXII 10585†…, 2018
2018
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Articles 1–20