Tim Grieb
Tim Grieb
Bremen, Germany
Verified email at ifp.uni-bremen.de
Cited by
Cited by
Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy
K Müller-Caspary, FF Krause, T Grieb, S Löffler, M Schowalter, A Béché, ...
Ultramicroscopy 178, 62-80, 2017
Determination of the chemical composition of GaNAs using STEM HAADF imaging and STEM strain state analysis
T Grieb, K Müller, R Fritz, M Schowalter, N Neugebohrn, N Knaub, K Volz, ...
Ultramicroscopy 117, 15-23, 2012
Effects of instrument imperfections on quantitative scanning transmission electron microscopy
FF Krause, M Schowalter, T Grieb, K Müller-Caspary, T Mehrtens, ...
Ultramicroscopy 161, 146-160, 2016
Screening Precursor–Solvent Combinations for Li4Ti5O12 Energy Storage Material Using Flame Spray Pyrolysis
F Meierhofer, H Li, M Gockeln, R Kun, T Grieb, A Rosenauer, U Fritsching, ...
ACS applied materials & interfaces 9 (43), 37760-37777, 2017
Synthesis route for the self-assembly of submicrometer-sized colloidosomes with tailorable nanopores
T Bollhorst, T Grieb, A Rosenauer, G Fuller, M Maas, K Rezwan
Chemistry of Materials 25 (17), 3464-3471, 2013
Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction
C Mahr, K Müller-Caspary, T Grieb, M Schowalter, T Mehrtens, FF Krause, ...
Ultramicroscopy 158, 38-48, 2015
Compositional characterization of GaAs/GaAsSb nanowires by quantitative HAADF-STEM
H Kauko, T Grieb, R Bjørge, M Schowalter, AM Munshi, H Weman, ...
Micron 44, 254-260, 2013
Quantitative chemical evaluation of dilute GaNAs using ADF STEM: Avoiding surface strain induced artifacts
T Grieb, K Müller, R Fritz, V Grillo, M Schowalter, K Volz, A Rosenauer
Ultramicroscopy 129, 1-9, 2013
Strain, composition and disorder in ADF imaging of semiconductors
V Grillo, K Mueller, K Volz, F Glas, T Grieb, A Rosenauer
Journal of Physics: Conference Series 326 (1), 012006, 2011
A critical study: Assessment of the effect of silica particles from 15 to 500 nm on bacterial viability
J Wehling, E Volkmann, T Grieb, A Rosenauer, M Maas, L Treccani, ...
Environmental pollution 176, 292-299, 2013
Preferential oxidation of carbon monoxide over Pt–FeOx/CeO2 synthesized by two-nozzle flame spray pyrolysis
JAH Dreyer, HK Grossmann, J Chen, T Grieb, BB Gong, PHL Sit, L Mädler, ...
Journal of Catalysis 329, 248-261, 2015
Materials characterisation by angle-resolved scanning transmission electron microscopy
K Müller-Caspary, O Oppermann, T Grieb, FF Krause, A Rosenauer, ...
Scientific reports 6 (1), 1-9, 2016
Nanoscale mixing during double-flame spray synthesis of heterostructured nanoparticles
HK Grossmann, T Grieb, F Meierhofer, MJ Hodapp, D Noriler, A Gröhn, ...
Journal of Nanoparticle Research 17 (4), 1-16, 2015
Near-surface depletion of antimony during the growth of GaAsSb and GaAs/GaAsSb nanowires
H Kauko, BO Fimland, T Grieb, AM Munshi, K Müller, A Rosenauer, ...
Journal of Applied Physics 116 (14), 144303, 2014
Ultrathin Au-alloy nanowires at the liquid–liquid interface
D Chatterjee, S Shetty, K Müller-Caspary, T Grieb, FF Krause, ...
Nano letters 18 (3), 1903-1907, 2018
Coherently embedded Ag nanostructures in Si: 3D imaging and their application to SERS
RR Juluri, A Rath, A Ghosh, A Bhukta, R Sathyavathi, DN Rao, K Müller, ...
Scientific reports 4 (1), 1-7, 2014
Direct measurement of polarization-induced fields in GaN/AlN by nano-beam electron diffraction
D Carvalho, K Müller-Caspary, M Schowalter, T Grieb, T Mehrtens, ...
Scientific reports 6 (1), 1-9, 2016
Simultaneous quantification of indium and nitrogen concentration in InGaNAs using HAADF-STEM
T Grieb, K Müller, E Cadel, A Beyer, M Schowalter, E Talbot, K Volz, ...
Microscopy and Microanalysis 20 (6), 1740-1752, 2014
Structural and spectroscopic comparison between polycrystalline, nanocrystalline and quantum dot visible light photo-catalyst Bi2WO6
M Teck, MM Murshed, M Schowalter, N Lefeld, HK Grossmann, T Grieb, ...
Journal of Solid State Chemistry 254, 82-89, 2017
Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction
C Mahr, K Müller-Caspary, R Ritz, M Simson, T Grieb, M Schowalter, ...
Ultramicroscopy 196, 74-82, 2019
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