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Co-authors
Haibo HeUniversity of Rhode IslandVerified email at uri.edu
Xiangnan ZhongUniversity of Rhode IslandVerified email at ele.uri.edu
Jinyu WenHuazhong University of Science and TechnologyVerified email at hust.edu.cn
Yufei TangAssistant Professor, Department of CEECS, Florida Atlantic UniversityVerified email at fau.edu
Fu,JianSchool of Automation, Wuhan University of TechnologyVerified email at whut.edu.cn
Yi GuoProfessor, Stevens Institute of TechnologyVerified email at stevens.edu
Xinming HuangWorcester Polytechnic InstituteVerified email at wpi.edu
Janusz StarzykOhio UniversityVerified email at ohio.edu
Siyao FuUniversity of Massachusetts BostonVerified email at umb.edu
Bo TangAssistant Professor, Mississippi State UniversityVerified email at ece.msstate.edu
Ah-Hwee TanNanyang Technological UniversityVerified email at ntu.edu.sg
Teng Teck Hou 邓德豪Deloitte Singapore, Risk Advisory - Strategic and Reputation RiskVerified email at deloitte.com
Zhen Ni
Verified email at fau.edu - Homepage